The influence of substrate temperature on the morphology, optical and electrical properties of thermal-evaporated ZnTe Thin Films

Applied Surface Science

Volumn 256, Issue 5, 2009, Pages 1566-1572

  Bacaksiz, E ^a   Aksu, S ^b   Ozer, N ^c   Tomakin, M ^d   Ozcelik A ^d  

^a KARADENIZ TECHNICAL UNIVERSITY   (Turkey)

^b SoloPower Inc   (United States)

^c SAN FRANCISCO STATE UNIVERSITY   (United States)

^d RECEP TAYYIP ERDOGAN UNIVERSITY   (Turkey)

Author keywords

Annealing temperature; Electrical resistivity; Microstructure; Optical band gap; Substrate temperature; Vacuum evaporation; ZnTe thin films

Indexed keywords

ANNEALING; DEPOSITION; ELECTRIC CONDUCTIVITY; ENERGY GAP; GRAIN GROWTH; GRAIN SIZE AND SHAPE; II-VI SEMICONDUCTORS; MICROSTRUCTURE; OPTICAL BAND GAPS; SCANNING ELECTRON MICROSCOPY; SIZE DISTRIBUTION; TELLURIUM COMPOUNDS; THIN FILMS; VACUUM EVAPORATION; ZINC COMPOUNDS; ZINC SULFIDE;

ANNEALING TEMPERATURES; GRAIN SIZE DISTRIBUTION; OPTICAL AND ELECTRICAL PROPERTIES; POST DEPOSITION ANNEALING; RESISTIVITY MEASUREMENT; SUBSTRATE TEMPERATURE; ZINC-BLENDE STRUCTURES; ZNTE THIN FILMS;

OPTICAL FILMS;

EID: 70849120653     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.09.023     Document Type: Article

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