Structural and surface analysis of thin-film ZnTe formed with pulsed-laser deposition

Surface Science

Volumn 600, Issue 18, 2006, Pages 3762-3765

  Erlacher, Artur ^a,b   Lukaszew, Alejandra R ^c   Jaeger, Herbert ^d   Ullrich, Bruno ^a  

^a BOWLING GREEN STATE UNIVERSITY   (United States)

^b UNIVERSITY OF GRAZ   (Austria)

^c UNIVERSITY OF TOLEDO   (United States)

^d MIAMI UNIVERSITY   (United States)

Author keywords

Atomic force microscopy; Pulsed laser deposition; X ray diffraction; Zinc telluride

Indexed keywords

ATOMIC FORCE MICROSCOPY; LASER PULSES; NEODYMIUM LASERS; PULSED LASER DEPOSITION; SURFACE ROUGHNESS; X RAY DIFFRACTION; ZINC COMPOUNDS;

ALL-OPTICAL LASER DIGITIZERS; PHOTONIC PROPERTIES; ZINC TELLURIDE;

THIN FILMS;

EID: 33749121334     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.02.061     Document Type: Article

References (24)

1. Yoshino K., Memon A., Yoneta M., Ohmori K., Saito H., and Ohishi M. Phys. Status Solidi (B) 229 (2002) 977
2. Sato K., Hanafusa M., Noda A., Arakawa A., Uchida M., Asahi T., and Oda O. J. Cryst. Growth 214/215 (2000) 1080
3. Rioux D., Niles D.W., and Hochst H. J. Appl. Phys. 73 12 (1993) 8381
4. Winnewisser C., Uhd Jepsen P., Schall M., Schyja V., and Helm J. Appl. Phys. Lett. 70 (1997) 3069
5. Liu K., Kang H., Kim T., and Zhang X.-C. Appl. Phys. Lett. 81 (2002) 4115
6. Shan C.X., Fan X.W., Zhang J.Y., et al. J. Vac. Sci. Technol. A-Vac. Surf. Films 20 6 (2002) 1886
7. Erlacher A., and Ullrich B. Semicond. Sci. Technol. 19 3 (2004) L9
8. Ullrich B., Erlacher A., and Danilov E.O. Semicond. Sci. Technol. 19 12 (2004) L111
9. Erlacher A., Miller H., and Ullrich B. J. Appl. Phys. 95 5 (2004) 2927
10. Erlacher A., Ullrich B., Konopinski R.J., and Haugan H.J. Proc. SPIE 5723 (2005) 179
11. Chang J.H., Takai T., Koo B.H., Song J.S., Handa T., and Yao T. Appl. Phys. Lett. 79 (2001) 785
12. Tanaka T., Hayashida K., Wang S., Guo Q., Nishio M., and Ogawa H. J. Cryst. Growth 248 (2003) 43
13. Ishizaki T., Ohtomo T., and Fuwa A. J. Phys. D 37 (2004) 255
14. Rouleau C.M., and Lowdnes D.H. Appl. Surf. Sci. 127-129 (1998) 418
15. Bhunia S., and Bose D.N. Solid State Phenom. 55 (1997) 43
16. Rajakarunanake Y., Luo Y., Aydinli A., Lavalle N., and Compaan A. Mater. Res. Soc. Symb. Proc. 268 (1992) 229
17. Erlacher A., Ambrico M., Perna G., Schiavulli L., Ligonzo T., Jaeger H., and Ullrich B. Appl. Surf. Sci. 258 (2005) 402
18. Kuzmany H. Solid-State Spectroscopy: an Introduction (1998), Springer, Berlin, New York p. 79
19. Miller J.C., and Haglund R.F. Laser Ablation and Desorption (1998), Academic Press, San Diego p. 187
20. Auciello O., and Dordrecht J. Multicomponent and multilayered thin-films for advanced microtechnologies: techniques, fundamentals, and devices (1993), Kluwer Academic, Boston p. 181
21. Moore C.J.L., and Brodie D.E. Can. J. Phys. 60 (1982) 340
22. Erlacher A., Ambrico M., Perna G., Schiavulli L., Ligonzo T., Jaeger H., and Ullrich B. Proc. SPIE 5850 (2004) 1
23. ASTM X-ray powder data 15-746.
24. ASTM X-ray powder data 19-1482.