Effects of substrate temperature and post-deposition anneal on properties of evaporated cadmium telluride films

Thin Solid Films

Volumn 515, Issue 5, 2007, Pages 3079-3084

  Bacaksiz, E ^a   Basol, B M ^b   Altunbas M ^a   Novruzov, V ^a   Yanmaz, E ^a   Nezir, S ^c  

^a KARADENIZ TECHNICAL UNIVERSITY   (Turkey)

^b NuTool Inc   (United States)

^c KIRIKKALE UNIVERSITY   (Turkey)

Author keywords

Annealing; Cadmium telluride; Evaporation; Optical properties; Scanning electorn microscopy; X ray diffraction

Indexed keywords

ANNEALING; CADMIUM COMPOUNDS; EVAPORATION; GRAIN SIZE AND SHAPE; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

CADMIUM TELLURIDE; GROWTH TEMPERATURE; OPTICAL BAND GAP MEASUREMENTS;

THIN FILMS;

EID: 33845953989     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.08.026     Document Type: Article

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