Preparation and characterization of ZnTe thin films by SILAR method

Applied Surface Science

Volumn 253, Issue 9, 2007, Pages 4335-4337

  Kale, S S ^b   Mane, R S ^b   Pathan, H M ^a   Shaikh, A V ^c   Joo, Oh Shim ^a   Han, Sung Hwan ^b  

^a Korea Institute of Science and Technology   (South Korea)

^b Hanyang University   (South Korea)

^c Poona College of Arts Science and Commerce   (India)

Author keywords

Optical studies; SEM; Solution chemistry; Thin films; XRD; ZnTe

Indexed keywords

FILM PREPARATION; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; SODIUM COMPOUNDS; SOLUTIONS; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION; ZINC COMPOUNDS;

SODIUM TELLURIDE; ZINC TELLURIDE (ZNTE);

THIN FILMS;

EID: 33846786999     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.09.043     Document Type: Article

References (5)

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5. Pathan H.M., and Lokhande C.D. Bull. Mater. Sci. 27 (2004) 85