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Applied Surface Science

Volumn 167, Issue 1, 2000, Pages 1-11

Optical and structural properties of two-sourced evaporated ZnTe thin films

(3) Aqili, Akram K S a Ali, Zulfiqar a Maqsood, Asghari a

a QUAID I AZAM UNIVERSITY (Pakistan)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY GAP; EVAPORATION; INFRARED SPECTROPHOTOMETERS; MATHEMATICAL MODELS; OSCILLATORS (ELECTRONIC); PHOTONS; REFRACTIVE INDEX; SEMICONDUCTING ZINC COMPOUNDS; SUBSTRATES; THIN FILMS; ULTRAVIOLET SPECTROPHOTOMETERS; X RAY DIFFRACTION ANALYSIS;

OPTICAL BAND GAPS; SINGLE OSCILLATOR MODELS; TWO-SOURCED EVAPORATED THIN FILMS;

OPTICAL FILMS;

EID: 0034301328 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(00)00498-0 Document Type: Article

Times cited : (66)

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