Suppression of corner effects in wide-channel triple-gate bulk FinFETs

Microelectronic Engineering

Volumn 87, Issue 2, 2010, Pages 192-199

  Poljak, Mirko ^a   Jovanović, Vladimir ^a   Suligoj, Tomislav ^a  

^a UNIVERSITY OF ZAGREB   (Croatia)

Author keywords

Body tied; Bulk; Corner effect; FinFET; Kink effect; Short channel effects; Triple gate MOSFET

Indexed keywords

BODY TIED; CORNER EFFECTS; KINK EFFECT; SHORT-CHANNEL EFFECT; TRIPLE-GATE MOSFETS;

FINS (HEAT EXCHANGE); LITHIUM BATTERIES; MOSFET DEVICES; THRESHOLD VOLTAGE;

FIELD EFFECT TRANSISTORS;

EID: 70450225392     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2009.07.013     Document Type: Article

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