-
1
-
-
70449478477
-
-
"Introduction to Microlithography", L.F. Thompson, C.G. Willson, M.J. Bowden, editors, American Chemical Society, Washington, D.C.
-
"Introduction to Microlithography", L.F. Thompson, C.G. Willson, M.J. Bowden, editors, ACS Professional Reference Book, American Chemical Society, Washington, D.C. 1994.
-
(1994)
ACS Professional Reference Book
-
-
-
2
-
-
0024121938
-
-
"Electronic and Photonic Applications of Polymers", Bowden, MJ., Turner, S.R., Editors
-
a) Willson, C.G., Bowden, MJ., In "Electronic and Photonic Applications of Polymers", Bowden, MJ., Turner, S.R., Editors, ACS Advances in Chemistry Series 218, 1988, pp75-108.
-
(1988)
ACS Advances in Chemistry Series
, vol.218
, pp. 75-108
-
-
Willson, C.G.1
Bowden, M.J.2
-
3
-
-
0004336833
-
-
b) Iwayanagi, T., Ueno, T., Nonogaki, S., Ito, H., Willson, C.G., ibid, pp109-224.
-
ACS Advances in Chemistry Series
, pp. 109-224
-
-
Iwayanagi, T.1
Ueno, T.2
Nonogaki, S.3
Ito, H.4
Willson, C.G.5
-
4
-
-
33751500109
-
-
Reichmanis, E., Houlihan, F.M., Nalamasu, O., Neenan, T.X., Chem Mater., 1991, 3, 394.
-
(1991)
Chem Mater.
, vol.3
, pp. 394
-
-
Reichmanis, E.1
Houlihan, F.M.2
Nalamasu, O.3
Neenan, T.X.4
-
5
-
-
0001386596
-
-
Nalamasu, O., Wallow, T.I., Houlihan, F.M., Reichmanis, E., Timko, A.G., Dabbagh, G. Cirelli, R.A., Hutton, R.S., Novembre, A.E., Future Fab International, 1997, 1 (2), 159.
-
(1997)
Future Fab International
, vol.1
, Issue.2
, pp. 159
-
-
Nalamasu, O.1
Wallow, T.I.2
Houlihan, F.M.3
Reichmanis, E.4
Timko, A.G.5
Dabbagh, G.6
Cirelli, R.A.7
Hutton, R.S.8
Novembre, A.E.9
-
8
-
-
0002623728
-
-
McClay, J.A., Mclntyre, S.L., Solid State Technology, 1999, 42(6),57.
-
(1999)
Solid State Technology
, vol.42
, Issue.6
, pp. 57
-
-
McClay, J.A.1
Mclntyre, S.L.2
-
9
-
-
0003937505
-
-
Shea, D., Editor, SPIE Optical Engineering Press, Bellingham, Washington
-
Dammel, R., "Diazonaphthoquinone-based Resists", Shea, D., Editor, SPIE Optical Engineering Press, Bellingham, Washington, 1993, p. 70.
-
(1993)
Diazonaphthoquinone-based Resists
, pp. 70
-
-
Dammel, R.1
-
10
-
-
0032841905
-
-
Reichmanis, E., Nalamasu, O., Houlihan, F. M., Accts. Chem. Res., 1999, 32, 659.
-
(1999)
Accts. Chem. Res.
, vol.32
, pp. 659
-
-
Reichmanis, E.1
Nalamasu, O.2
Houlihan, F.M.3
-
11
-
-
0002266436
-
-
Kanagawa, Japan, September
-
a) Willson, C.G., Ito, H., Frechet, J.M.J., Digest of Technical Papers - 1982 Symposium on VLSI Technology, Kanagawa, Japan, p. 86 (September 1982).
-
(1982)
Digest of Technical Papers - 1982 Symposium on VLSI Technology
, pp. 86
-
-
Willson, C.G.1
Ito, H.2
Frechet, J.M.J.3
-
12
-
-
0022493649
-
-
b) Willson, C.G., Ito, H., Frechet, J.M.J., Tessier, T.G., Houlihan, F.M., J Electrochem. Soc., 1986, 133, 181.
-
(1986)
J Electrochem. Soc.
, vol.133
, pp. 181
-
-
Willson, C.G.1
Ito, H.2
Frechet, J.M.J.3
Tessier, T.G.4
Houlihan, F.M.5
-
13
-
-
0001640483
-
-
a) Houlihan, F.M., Neenan, T.X., Reichmanis, E., Kometani, J.M., Chin, T., Chem. Mater., 1991, 3, 462.
-
(1991)
Chem. Mater.
, vol.3
, pp. 462
-
-
Houlihan, F.M.1
Neenan, T.X.2
Reichmanis, E.3
Kometani, J.M.4
Chin, T.5
-
14
-
-
0000408859
-
-
b) Kanga, R.S., Kometani, J.M., Reichmanis, E., Hanson, J.E., Nalamasu, O., Thompson, L.F., Heffner, S.A., Tai, W.W., Trevor, P., Chem. Mater., 1991, 3, 660.
-
(1991)
Chem. Mater.
, vol.3
, pp. 660
-
-
Kanga, R.S.1
Kometani, J.M.2
Reichmanis, E.3
Hanson, J.E.4
Nalamasu, O.5
Thompson, L.F.6
Heffner, S.A.7
Tai, W.W.8
Trevor, P.9
-
15
-
-
0002578796
-
-
Polymers in Microlithography", Reichmanis, E., MacDonald, S.A., Iwayanagi, T., Editors, ACS Washington, D.C.
-
c) Houlihan, F.M., Reichmanis, E., Thompson, L.F., Tarascón, R.G., In "Polymers in Microlithography", ACS Symposium Series 412, Reichmanis, E., MacDonald, S.A., Iwayanagi, T., Editors, ACS Washington, D.C., 1989, pp39-56.
-
(1989)
ACS Symposium Series 412
, pp. 39-56
-
-
Houlihan, F.M.1
Reichmanis, E.2
Thompson, L.F.3
Tarascón, R.G.4
-
16
-
-
70449487080
-
-
a) Nalamasu, O., Houlihan, F.M., Cirelli, R.A., Timko, A.G., Watson, G.P., Hutton, R.S., Reichmanis, E., Gabor, A.H., Medina, A.N., Dimov, O., Neisser, M.O., Bowden, MJ., Future Fab International, 1999, number 8, 157.
-
(1999)
Future Fab International
, vol.157
, Issue.8
-
-
Nalamasu, O.1
Houlihan, F.M.2
Cirelli, R.A.3
Timko, A.G.4
Watson, G.P.5
Hutton, R.S.6
Reichmanis, E.7
Gabor, A.H.8
Medina, A.N.9
Dimov, O.10
Neisser, M.O.11
Bowden, M.J.12
-
17
-
-
0002811027
-
-
b) Nalamasu, O., Houlihan, F.M., Cirelli, R.A., Watson, P., Reichmanis, E., Solid State Technology, 1999, 42(5), 29.
-
(1999)
Solid State Technology
, vol.42
, Issue.5
, pp. 29
-
-
Nalamasu, O.1
Houlihan, F.M.2
Cirelli, R.A.3
Watson, P.4
Reichmanis, E.5
-
19
-
-
0000507365
-
-
b) Ronse, K., Vandenberghe, G., Jaenen, P., Delvaux, D., Vangoidsenhoven, D., Van Roey, F., Pollers, I., Maenhoudt, M., Goethals, A.M., Pollentier, I., Vleeming, B., van Ingen Schenau, K., Heskamp, B., Davies, G., Finders, J., Niroomand, A., Proc SPIE, 2000, 4000, 410.
-
(2000)
Proc SPIE
, vol.4000
, pp. 410
-
-
Ronse, K.1
Vandenberghe, G.2
Jaenen, P.3
Delvaux, D.4
Vangoidsenhoven, D.5
Van Roey, F.6
Pollers, I.7
Maenhoudt, M.8
Goethals, A.M.9
Pollentier, I.10
Vleeming, B.11
Van Ingen Schenau, K.12
Heskamp, B.13
Davies, G.14
Finders, J.15
Niroomand, A.16
-
20
-
-
0016567598
-
-
a) Bowden, M.J., Chandross, E.A., J Electrochem. Soc., 1975, 122, 1370.
-
(1975)
J Electrochem. Soc.
, vol.122
, pp. 1370
-
-
Bowden, M.J.1
Chandross, E.A.2
-
21
-
-
0003653412
-
-
Eastman Kodak, Rochester, NY
-
b) Feldman, M., White, D.L., Chandross, E.A., Bowden, M.J., Proceedings, Kodak Microelectronics Seminar, Eastman Kodak, Rochester, NY, 1975, p40.
-
(1975)
Proceedings, Kodak Microelectronics Seminar
, pp. 40
-
-
Feldman, M.1
White, D.L.2
Chandross, E.A.3
Bowden, M.J.4
-
22
-
-
0019634649
-
-
a) Ohnishi, Y., Mizuko, M., Gokan, H., Fujiwara, S., J. Vac, Sei. Technol., 1981, 19(4), 1141.
-
(1981)
J. Vac, Sei. Technol.
, vol.19
, Issue.4
, pp. 1141
-
-
Ohnishi, Y.1
Mizuko, M.2
Gokan, H.3
Fujiwara, S.4
-
23
-
-
0020497931
-
-
b) Gokan, H., Esho, S., Ohnishi, Y., J. Electrochem. Soc, 1983, 130(1), 143.
-
(1983)
J. Electrochem. Soc
, vol.130
, Issue.1
, pp. 143
-
-
Gokan, H.1
Esho, S.2
Ohnishi, Y.3
-
24
-
-
0003114357
-
-
Kunz, R., Palmateer, S.C., Forte, A.R., Allen, R.D., Wallraff, G.M., DiPietro, R.A., Hofer, D.C., Proc. SPIE, 1993, 1925, 167.
-
(1993)
Proc. SPIE
, vol.1925
, pp. 167
-
-
Kunz, R.1
Palmateer, S.C.2
Forte, A.R.3
Allen, R.D.4
Wallraff, G.M.5
Dipietro, R.A.6
Hofer, D.C.7
-
25
-
-
0029227194
-
-
Allen, R.D., Wallraff, G.M., DiPietro, R.A., Hofer, D.C, Kunz, R.R., Proc. SPIE, 1995, 2438, 474.
-
(1995)
Proc. SPIE
, vol.2438
, pp. 474
-
-
Allen, R.D.1
Wallraff, G.M.2
Dipietro, R.A.3
Hofer, D.C.4
Kunz, R.R.5
-
26
-
-
2842567164
-
-
Kunz, R.R, Allen, R.D., Hinsberg, W.D., Wallraff, G.M., Proc. SPIE, 1993, 1925, 167.
-
(1993)
Proc. SPIE
, vol.1925
, pp. 167
-
-
Kunz, R.R.1
Allen, R.D.2
Hinsberg, W.D.3
Wallraff, G.M.4
-
27
-
-
0000813458
-
-
Shida, N., Ushiroguchi, T., Asakawa, K., Nakase, M., J. Photopolym. Sei. Technol, 1996, 9, 457.
-
(1996)
J. Photopolym. Sei. Technol
, vol.9
, pp. 457
-
-
Shida, N.1
Ushiroguchi, T.2
Asakawa, K.3
Nakase, M.4
-
28
-
-
0029233594
-
-
a) Takahasi, M., Takechi, S., Proc. SPIE, 1995, 2438, 422.
-
(1995)
Proc. SPIE
, vol.2438
, pp. 422
-
-
Takahasi, M.1
Takechi, S.2
-
29
-
-
33749291941
-
-
b) Takechi, S. Takahashi, M., Kotachi, K., Nozaki, K., Yano, E., Hanyu, I., J. Photopolym. Sei. Technol, 1996, 9, 475.
-
(1996)
J. Photopolym. Sei. Technol
, vol.9
, pp. 475
-
-
Takechi, S.1
Takahashi, M.2
Kotachi, K.3
Nozaki, K.4
Yano, E.5
Hanyu, I.6
-
30
-
-
0019633512
-
-
a) Reichmanis, E., Wilkins, C.W., Jr., Chandross, E.A., J. Vac. Sei. Technol, 1981, 19(4), 1338.
-
(1981)
J. Vac. Sci. Technol
, vol.19
, Issue.4
, pp. 1338
-
-
Reichmanis, E.1
Wilkins Jr., C.W.2
Chandross, E.A.3
-
31
-
-
0020203742
-
-
b) Wilkins, C.W., Jr., Reichmanis, E., Chandross, E.A., J. Electrochem. Soc., 1982, 129(11), 2552.
-
(1982)
J. Electrochem. Soc.
, vol.129
, Issue.11
, pp. 2552
-
-
Wilkins Jr., C.W.1
Reichmanis, E.2
Chandross, E.A.3
-
34
-
-
0031248699
-
-
a) Houlihan, F.M., Wallow, T.I., Nalamasu, O., Reichmanis, E., Macromolecules, 1997, 30, 6517.
-
(1997)
Macromolecules
, vol.30
, pp. 6517
-
-
Houlihan, F.M.1
Wallow, T.I.2
Nalamasu, O.3
Reichmanis, E.4
-
35
-
-
0029727391
-
-
b) Wallow, T.I., Houlihan, F.M., Nalamasu, O., Chandross, E.A., Neenan, T.X., Reichmanis, E., Proc. SPIE, 1996, 2724, 355.
-
(1996)
Proc. SPIE
, vol.2724
, pp. 355
-
-
Wallow, T.I.1
Houlihan, F.M.2
Nalamasu, O.3
Chandross, E.A.4
Neenan, T.X.5
Reichmanis, E.6
-
36
-
-
0002432804
-
-
a) Houlihan, F.M., Wallow, T.I., Timko, A.G., Neria, S.E., Hutton, R.S., Cirelli, R.A., Nalamasu, O., Reichmanis, E., Proc. SPIE, 1997, 3049, 84.
-
(1997)
Proc. SPIE
, vol.3049
, pp. 84
-
-
Houlihan, F.M.1
Wallow, T.I.2
Timko, A.G.3
Neria, S.E.4
Hutton, R.S.5
Cirelli, R.A.6
Nalamasu, O.7
Reichmanis, E.8
-
37
-
-
0001104665
-
-
b) Reichmanis, E., Nalamasu, O., Houlihan, F.M., Wallow, T.I., Timko, A.G., Cirelli, R.A., Dabbagh, G., Hutton, R.S., Novembre, A.E., Smith, B.W., J. Vac Sei. Technol. B, 1997, 15(6), 2528.
-
(1997)
J. Vac Sei. Technol. B
, vol.15
, Issue.6
, pp. 2528
-
-
Reichmanis, E.1
Nalamasu, O.2
Houlihan, F.M.3
Wallow, T.I.4
Timko, A.G.5
Cirelli, R.A.6
Dabbagh, G.7
Hutton, R.S.8
Novembre, A.E.9
Smith, B.W.10
-
38
-
-
0000449507
-
-
(c) Houlihan, F.M., Wallow, T.I., Timko, A.G., Neria, S.E., Hutton, R.S., Cirelli, R.A., Kometani, J.M., Nalamasu, O., Reichmanis, E., J. Photopolym. Sei. Technol, 1997, 19(3), 511.
-
(1997)
J. Photopolym. Sei. Technol
, vol.19
, Issue.3
, pp. 511
-
-
Houlihan, F.M.1
Wallow, T.I.2
Timko, A.G.3
Neria, S.E.4
Hutton, R.S.5
Cirelli, R.A.6
Kometani, J.M.7
Nalamasu, O.8
Reichmanis, E.9
-
39
-
-
60849085199
-
-
Houlihan, F. M., Kometani, J.M., Timko, A.G., Hutton, R.S., Cirelli, R.A., Reichmanis, E., Nalamasu, O., Gabor, A.H., Medina, A.N., Biafore, J.J., Slater, S.G., Proc. SPIE, 1998, 3333, 73.
-
(1998)
Proc. SPIE
, vol.3333
, pp. 73
-
-
Houlihan, F.M.1
Kometani, J.M.2
Timko, A.G.3
Hutton, R.S.4
Cirelli, R.A.5
Reichmanis, E.6
Nalamasu, O.7
Gabor, A.H.8
Medina, A.N.9
Biafore, J.J.10
Slater, S.G.11
-
40
-
-
0006588054
-
-
a) Patterson, K., Okoroanyanwu, U., Shimokawa, T., Cho, S., Byers, J., Willson, CG., Proc. SPIE, 1998, 3333, 425;
-
(1998)
Proc. SPIE
, vol.3333
, pp. 425
-
-
Patterson, K.1
Okoroanyanwu, U.2
Shimokawa, T.3
Cho, S.4
Byers, J.5
Willson, C.G.6
-
41
-
-
0032629240
-
-
b) Rushkin, I.L., Houlihan, F.M., Kometani, J.M., Hutton, R.S., Timko, A.G., Reichmanis, E., Nalamasu, O., Gabor, A.H., Medina, A.N., Slater, S.G., Neisser, M., Proc. SPIE1 1999, 3678, 44;
-
(1999)
Proc. SPIE
, vol.3678
, pp. 44
-
-
Rushkin, I.L.1
Houlihan, F.M.2
Kometani, J.M.3
Hutton, R.S.4
Timko, A.G.5
Reichmanis, E.6
Nalamasu, O.7
Gabor, A.H.8
Medina, A.N.9
Slater, S.G.10
Neisser, M.11
-
42
-
-
0001239489
-
-
Allen, R.D., Optiz, J., Ito, H., Wallow, T.I., Casmier, CE., Larson, R., Sooriyakumaran, R., Hofer, D.C, Varanasi, P.R., J. Photopolym. Sei and Technol, 1999, 12(3), 501;
-
(1999)
J. Photopolym. Sei and Technol
, vol.12
, Issue.3
, pp. 501
-
-
Allen, R.D.1
Optiz, J.2
Ito, H.3
Wallow, T.I.4
Casmier, C.E.5
Larson, R.6
Sooriyakumaran, R.7
Hofer, D.C.8
Varanasi, P.R.9
-
43
-
-
0003126842
-
-
Jung, J.-C, Bok, C-K., Baik, K.-H., Proc. SPIE, 1998, 3333, 11;
-
(1998)
Proc. SPIE
, vol.3333
, pp. 11
-
-
Jung, J.-C.1
Bok, C.-K.2
Baik, K.-H.3
-
44
-
-
0033689387
-
-
e) Klopp, J.M., Pasini, D., Frechet, J.M.J., Byers, J.D., Proc SPIE, 2000, 3999, 23;
-
(2000)
Proc SPIE
, vol.3999
, pp. 23
-
-
Klopp, J.M.1
Pasini, D.2
Frechet, J.M.J.3
Byers, J.D.4
-
45
-
-
0001677969
-
-
f) Park, J.-H., Kim, J.-Y., Seo, D.-C, Park, S.-Y., Lee, H., Kim, S.-J., Jung, J.-C, Baik, K.-H., Proc. SPIE, 2000, 3999, 1163.
-
(2000)
Proc. SPIE
, vol.3999
, pp. 1163
-
-
Park, J.-H.1
Kim, J.-Y.2
Seo, D.-C.3
Park, S.-Y.4
Lee, H.5
Kim, S.-J.6
Jung, J.-C.7
Baik, K.-H.8
-
47
-
-
0034583945
-
-
b) Rothschild, M., Bloomstein, T.M., Fedynyshyn, T.H., Kunz, R.R., Liberman, V., Switkes, M., J. Photopolym. Sei and Technol, 2000, 13(3), 369.
-
(2000)
J. Photopolym. Sei and Technol
, vol.13
, Issue.3
, pp. 369
-
-
Rothschild, M.1
Bloomstein, T.M.2
Fedynyshyn, T.H.3
Kunz, R.R.4
Liberman, V.5
Switkes, M.6
-
48
-
-
0032675485
-
-
a) Kunz, R.R., Bloomstein, T.M., Hardy, D.E., Goodman, R.B., Downs, D.K., Curtin, J.E., Proc. SPIE, 1999, 3678, 13;
-
(1999)
Proc. SPIE
, vol.3678
, pp. 13
-
-
Kunz, R.R.1
Bloomstein, T.M.2
Hardy, D.E.3
Goodman, R.B.4
Downs, D.K.5
Curtin, J.E.6
-
49
-
-
0000253787
-
-
b) Fedynyshyn, T.H., Kunz, R.R., Doran, S.P., Goodman, R.B., Lind, M.L., Curtin, J.E., Proc. SPIE, 2000, 3999, 335.
-
(2000)
Proc. SPIE
, vol.3999
, pp. 335
-
-
Fedynyshyn, T.H.1
Kunz, R.R.2
Doran, S.P.3
Goodman, R.B.4
Lind, M.L.5
Curtin, J.E.6
-
50
-
-
0033689386
-
-
a) Patterson, K., Yamachika, M., Hung, R., Brodsky, C., Yamada, S., Somervell, M., Osborn, B., Hall, D., Dukovic, G., Byers, J., Conley, W., Willson, CG., Proc. SPIE, 2000, 3999, 365;
-
(2000)
Proc. SPIE
, vol.3999
, pp. 365
-
-
Patterson, K.1
Yamachika, M.2
Hung, R.3
Brodsky, C.4
Yamada, S.5
Somervell, M.6
Osborn, B.7
Hall, D.8
Dukovic, G.9
Byers, J.10
Conley, W.11
Willson, C.G.12
-
51
-
-
0034584791
-
-
b) Chiba, T. Hung, R.J. Yamada, S., Trinque, B., Yamachika, M., Brodsky, C., Patterson, K., Heyden, A.V., Jamison, A., Lin, S.-H., Somervell, M., Byers, J. Conley, W., Willson, CG., J Photopolym. Sci. Technol, 2000, 13(3), 657.
-
(2000)
J Photopolym. Sci. Technol
, vol.13
, Issue.3
, pp. 657
-
-
Hung, C.T.1
Yamada S, R.J.2
Trinque, B.3
Yamachika, M.4
Brodsky, C.5
Patterson, K.6
Heyden, A.V.7
Jamison, A.8
Lin, S.-H.9
Somervell, M.10
Byers, J.11
Conley, J.W.12
Willson, C.G.13
-
52
-
-
0034583990
-
-
a) Schmaljohann, D., Bae, Y.C., Dai, J., Weibel, G.L., Hamad, A.H., Ober, C.K., J. Photopolym. Sei. Technol, 2000, 13(3), 451;
-
(2000)
J. Photopolym. Sei. Technol
, vol.13
, Issue.3
, pp. 451
-
-
Schmaljohann, D.1
Bae, Y.C.2
Dai, J.3
Weibel, G.L.4
Hamad, A.H.5
Ober, C.K.6
-
53
-
-
0002895065
-
-
Dana Point, CA, Proceedings Book 2
-
b) Bae, Y. C., Schalmjohann, D., Hamad, A.H., Dai, J., Weibel, G.L., Yu,T., Ober, C.K., The First International Symposium on 157 nm Lithography, Dana Point, CA, Proceedings Book 2, pg. 727, 2000.
-
(2000)
The First International Symposium on 157 Nm Lithography
, pp. 727
-
-
Bae, Y.C.1
Schalmjohann, D.2
Hamad, A.H.3
Dai, J.4
Weibel, G.L.5
Yu, T.6
Ober, C.K.7
-
54
-
-
0000604618
-
-
Crawford, M.K., Feiring, A.E., Feldman, J., French, R.H., Periyasamy, M., Schadt III, F.L., Smalley, RJ., Zumsteg, F.C., Kunz, R.R., Rao, V., Holi, S.M., Proc SPIE, 2000, 3999, 357.
-
(2000)
Proc SPIE
, vol.3999
, pp. 357
-
-
Crawford, M.K.1
Feiring, A.E.2
Feldman, J.3
French, R.H.4
Periyasamy, M.5
Schadt Iii, F.L.6
Smalley, R.J.7
Zumsteg, F.C.8
Kunz, R.R.9
Rao, V.10
Holi, S.M.11
|