Higher harmonics generation in tapping mode atomic force microscope

Chinese Physics Letters

Volumn 26, Issue 10, 2009, Pages

  Yuan, Li ^a   Jian Qiang, Qian ^a  

^a BEIHANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; HARMONIC ANALYSIS; SENSITIVITY ANALYSIS;

AFM; ATOMIC FORCE; HARMONIC AMPLITUDE; HARMONICS COMPONENT; HIGH HARMONIC GENERATION; HIGHER HARMONICS; INCREASING SENSITIVITIES; ORDERS OF MAGNITUDE; PHASE LAGS; TAPPING MODES;

TAPS;

EID: 70449428808     PISSN: 0256307X     EISSN: 17413540     Source Type: Journal    
DOI: 10.1088/0256-307X/26/10/100703     Document Type: Article

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