메뉴 건너뛰기




Volumn 97, Issue 1-4, 2003, Pages 171-175

Imaging cobalt nanoparticles by amplitude modulation atomic force microscopy: Comparison between low and high amplitude solutions

Author keywords

Amplitude modulation; Atomic force microscope; Nanoparticles

Indexed keywords

AMPLITUDE MODULATION; ATOMIC FORCE MICROSCOPY; DEFORMATION; IMAGING TECHNIQUES; NANOSTRUCTURED MATERIALS; PHYSICAL PROPERTIES;

EID: 0038542115     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00041-X     Document Type: Article
Times cited : (14)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.