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Volumn 97, Issue 1-4, 2003, Pages 171-175
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Imaging cobalt nanoparticles by amplitude modulation atomic force microscopy: Comparison between low and high amplitude solutions
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Author keywords
Amplitude modulation; Atomic force microscope; Nanoparticles
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Indexed keywords
AMPLITUDE MODULATION;
ATOMIC FORCE MICROSCOPY;
DEFORMATION;
IMAGING TECHNIQUES;
NANOSTRUCTURED MATERIALS;
PHYSICAL PROPERTIES;
NANOPARTICLES;
COBALT;
COBALT;
NANOPARTICLE;
AMPLITUDE MODULATION;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
FORCE;
IMAGE ANALYSIS;
IMAGING;
INTERMETHOD COMPARISON;
PERFORMANCE;
THEORETICAL MODEL;
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EID: 0038542115
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-3991(03)00041-X Document Type: Article |
Times cited : (14)
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References (18)
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