-
1
-
-
1642407142
-
-
Salam B., Virseda C., Da H., Ekere N.N., and Durairaj R. Solder. Surf. Mt. Technol. 16 (2004) 27-34
-
(2004)
Solder. Surf. Mt. Technol.
, vol.16
, pp. 27-34
-
-
Salam, B.1
Virseda, C.2
Da, H.3
Ekere, N.N.4
Durairaj, R.5
-
2
-
-
33646147807
-
-
Hung F.Y., Lin H.M., Chen P.S., Liu T.S., and Chen L.H. J. Alloys Compd. 415 (2006) 85-92
-
(2006)
J. Alloys Compd.
, vol.415
, pp. 85-92
-
-
Hung, F.Y.1
Lin, H.M.2
Chen, P.S.3
Liu, T.S.4
Chen, L.H.5
-
3
-
-
62549166622
-
-
Xu H.B., Li M.Y., Chen H.T., Fu Y.G., and Wang L. J. Electron. Mater. 38 (2009) 663-669
-
(2009)
J. Electron. Mater.
, vol.38
, pp. 663-669
-
-
Xu, H.B.1
Li, M.Y.2
Chen, H.T.3
Fu, Y.G.4
Wang, L.5
-
7
-
-
58349107235
-
-
Sungovsky P., McCormick H., Bagheri S., Bagheri Z., Hamilton C., and Romansky M. J. Electron. Mater. 38 (2009) 292-302
-
(2009)
J. Electron. Mater.
, vol.38
, pp. 292-302
-
-
Sungovsky, P.1
McCormick, H.2
Bagheri, S.3
Bagheri, Z.4
Hamilton, C.5
Romansky, M.6
-
9
-
-
67349116321
-
-
Durairaj R., Ramesh S., Mallik S., Seman A., and Ekere N. Mater. Des. 30 (2009) 3812-3818
-
(2009)
Mater. Des.
, vol.30
, pp. 3812-3818
-
-
Durairaj, R.1
Ramesh, S.2
Mallik, S.3
Seman, A.4
Ekere, N.5
-
11
-
-
48649099044
-
-
Hsiung C.K., Chang C.A., Lai J.J., Tzeng Z.H., Ho C.S., and Chien F.L. Proceedings of the International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) (2007) 327-330
-
(2007)
Proceedings of the International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)
, pp. 327-330
-
-
Hsiung, C.K.1
Chang, C.A.2
Lai, J.J.3
Tzeng, Z.H.4
Ho, C.S.5
Chien, F.L.6
-
12
-
-
34047252502
-
-
Rufino B., Boulc'h F., Coulet M.V., Lacroix G., and Denoyel R. Acta Mater. 55 (2007) 2815-2827
-
(2007)
Acta Mater.
, vol.55
, pp. 2815-2827
-
-
Rufino, B.1
Boulc'h, F.2
Coulet, M.V.3
Lacroix, G.4
Denoyel, R.5
-
14
-
-
4544255165
-
-
An B., Zheng Z., Wu F., Lu J., Zhang X., and Wu Y. Proceedings of 2004 International Conference on the Business of Electronic Product Reliability and Liability (2004) 92-95
-
(2004)
Proceedings of 2004 International Conference on the Business of Electronic Product Reliability and Liability
, pp. 92-95
-
-
An, B.1
Zheng, Z.2
Wu, F.3
Lu, J.4
Zhang, X.5
Wu, Y.6
-
15
-
-
0032050137
-
-
Kuhmann J.F., Preuss A., Adolphi B., Maly K., Wirth T., Oesterle W., Pittroff W., Weyer G., and Fanciully M. IEEE Trans. Compon. Packag. Manuf. Technol. C 21 (1998) 134-141
-
(1998)
IEEE Trans. Compon. Packag. Manuf. Technol. C
, vol.21
, pp. 134-141
-
-
Kuhmann, J.F.1
Preuss, A.2
Adolphi, B.3
Maly, K.4
Wirth, T.5
Oesterle, W.6
Pittroff, W.7
Weyer, G.8
Fanciully, M.9
-
17
-
-
40749132962
-
-
Lee J.E., Kim K.S., Inoue M., Jiang J.X., and Suganuma K. J. Alloys Compd. 454 (2008) 310-320
-
(2008)
J. Alloys Compd.
, vol.454
, pp. 310-320
-
-
Lee, J.E.1
Kim, K.S.2
Inoue, M.3
Jiang, J.X.4
Suganuma, K.5
-
20
-
-
70350619581
-
-
IPC-TM-650 2.4.43 Solder Ball Testing, Test Methods Manual, Northbrook, IL 60062-6135, pp.1-3.
-
IPC-TM-650 2.4.43 Solder Ball Testing, Test Methods Manual, Northbrook, IL 60062-6135, pp.1-3.
-
-
-
|