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Volumn , Issue , 2009, Pages 276-281

DfT reuse for low-cost radiation testing of SoCs: A case study

Author keywords

DfT; Radiation experiments; Reliability

Indexed keywords

ACCURATE MEASUREMENT; DATA COLLECTION; DFT; DIAGNOSTIC FEATURES; EMBEDDED CORES; EMBEDDED SRAM; HARDWARE TEST; LOW-COST STRATEGIES; MANUFACTURING TESTS; ON-CHIP DESIGNS; RADIATION EXPERIMENT; RADIATION EXPERIMENTS; RADIATION TESTING; SOFTWARE TOOL; SYSTEMS ON CHIPS; TRANSIENT EFFECT;

EID: 70350374095     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2009.26     Document Type: Conference Paper
Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.