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Volumn , Issue , 2005, Pages 22-27

Using infrastructure IPs to support SW-based self-test of processor cores

Author keywords

[No Author keywords available]

Indexed keywords

CORE MODULARITY; SELF-TEST APPROACH; SYSTEM-ON-CHIP (SOC);

EID: 28744444722     PISSN: 15504093     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MTV.2004.25     Document Type: Conference Paper
Times cited : (21)

References (16)
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    • Zorian, Y.1    Dey, S.2    Rodgers, M.3
  • 3
    • 0033307908 scopus 로고    scopus 로고
    • Testing a system-on-a-chip with embedded microprocessor
    • R. Rajuman, "Testing a System-On-a-Chip with Embedded Microprocessor", IEEE ITC, 1999, pp. 499-508
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    • Rajuman, R.1
  • 4
    • 0019030438 scopus 로고
    • Test generation for microprocessors
    • June
    • S. Thatte, J. Abraham, "Test Generation for Microprocessors", IEEE Transaction on Computer, Vol. C-29, June 1980, pp. 429 - 441
    • (1980) IEEE Transaction on Computer , vol.C-29 , pp. 429-441
    • Thatte, S.1    Abraham, J.2
  • 5
    • 0142246920 scopus 로고    scopus 로고
    • Application and analysis of RT-level software-based self-testing for embedded processor cores
    • K. Kranitis, G. Xenoulis, A. Pascalis, D. Gizopoulos, Y. Zorian, "Application and Analysis of RT-Level Software-Based Self-Testing for Embedded Processor Cores", IEEE ITC, 2003, pp. 431 - 440
    • (2003) IEEE ITC , pp. 431-440
    • Kranitis, K.1    Xenoulis, G.2    Pascalis, A.3    Gizopoulos, D.4    Zorian, Y.5
  • 6
    • 0035272504 scopus 로고    scopus 로고
    • Software-based self-testing methodology for processor cores
    • March
    • L. Chen, S. Dey, "Software-based Self-Testing Methodology for Processor Cores", IEEE Transaction on CAD of Integrated Circuit, Vol. 20, March 2001, pp. 369-380
    • (2001) IEEE Transaction on CAD of Integrated Circuit , vol.20 , pp. 369-380
    • Chen, L.1    Dey, S.2
  • 8
    • 0036446185 scopus 로고    scopus 로고
    • Adapting a SoC to ATE concurrent test capabilities
    • R. Dorsch, R. Huerta, H. Wunderlich, M. Fisher, "Adapting a SoC to ATE Concurrent Test Capabilities", IEEE ITC, 2002, pp. 1169 - 1175
    • (2002) IEEE ITC , pp. 1169-1175
    • Dorsch, R.1    Huerta, R.2    Wunderlich, H.3    Fisher, M.4
  • 9
    • 0346119949 scopus 로고    scopus 로고
    • Test access mechanism optimization, test scheduling, and tester data volume reduction for system-on-chip
    • December
    • V. Iyengar, K. Chakrabarty, E. Marinissen, "Test Access Mechanism Optimization, Test Scheduling, and Tester Data Volume Reduction for System-on-Chip", IEEE Transaction on Computer, Vol. 52, December 2003, pp. 1619-1631
    • (2003) IEEE Transaction on Computer , vol.52 , pp. 1619-1631
    • Iyengar, V.1    Chakrabarty, K.2    Marinissen, E.3
  • 11
    • 0032306079 scopus 로고    scopus 로고
    • Testing embedded-core based system chips
    • Y. Zorian, E. Marinissen, S. Dey, "Testing Embedded-Core Based System Chips", IEEE ITC, 2002, pp. 130-143
    • (2002) IEEE ITC , pp. 130-143
    • Zorian, Y.1    Marinissen, E.2    Dey, S.3
  • 13
    • 28744447558 scopus 로고    scopus 로고
    • SoC design and test consideration
    • M. Schrader, R. McConnell, "SoC Design and Test Consideration", IEEE DATE Conference, 2003, pp. 202 - 207 suppl.
    • (2003) IEEE DATE Conference , Issue.SUPPL. , pp. 202-207
    • Schrader, M.1    McConnell, R.2
  • 14
    • 28744442159 scopus 로고    scopus 로고
    • An efficient approach to SoC wrapper design, TAM configuration and test scheduling
    • J. Pouget, E. Larsson, Z. Peng, M. Flottes, B. Rouzeyre, "An efficient Approach to SoC Wrapper Design, TAM Configuration and Test Scheduling", IEEE ETW, 2003, pp. 117-123
    • (2003) IEEE ETW , pp. 117-123
    • Pouget, J.1    Larsson, E.2    Peng, Z.3    Flottes, M.4    Rouzeyre, B.5
  • 15
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    • What is an infrastructure IP?
    • Y. Zorian, "What is an Infrastructure IP?", IEEE Design & Test of Computers, Vol. 19, No. 3, 2002, pp.5-7
    • (2002) IEEE Design & Test of Computers , vol.19 , Issue.3 , pp. 5-7
    • Zorian, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.