-
1
-
-
0032306079
-
Testing embedded-core based system chips
-
Oct.
-
Y. Zorian, E. J. Marinissen, and S. Dey, "Testing embedded-core based system chips", in Proc. International Test Conference, Oct. 1998, pp. 130-143
-
(1998)
Proc. International Test Conference
, pp. 130-143
-
-
Zorian, Y.1
Marinissen, E.J.2
Dey, S.3
-
2
-
-
0031249773
-
Using partial isolation rings to test core-based designs
-
Oct.-Dec.
-
N. Touba, and B. Pouya, "Using Partial Isolation Rings to test Core-Based Designs", IEEE Design and Test of Computers, vol. 14, Oct.-Dec. 1997, pp. 52-59
-
(1997)
IEEE Design and Test of Computers
, vol.14
, pp. 52-59
-
-
Touba, N.1
Pouya, B.2
-
3
-
-
84961244832
-
Macro Testability: The results of production device applications
-
F. Bouwman, S. Oostdijk, R. Stans, B. Bennetts, and F. Beenker, "Macro Testability: the results of production device applications", IEEE International Test Conference, 1992, pp. 232-241
-
(1992)
IEEE International Test Conference
, pp. 232-241
-
-
Bouwman, F.1
Oostdijk, S.2
Stans, R.3
Bennetts, B.4
Beenker, F.5
-
4
-
-
0034247857
-
A fast and low-cost testing technique for core-base system-chips
-
Aug.
-
I. Ghosh, N. Jha, and S. Dey, "A Fast and Low-Cost Testing Technique for Core-Base System-Chips", IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 19, No. 8, Aug. 2000, pp. 863-877
-
(2000)
IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems
, vol.19
, Issue.8
, pp. 863-877
-
-
Ghosh, I.1
Jha, N.2
Dey, S.3
-
5
-
-
0032640869
-
Microprocessor based testing for core-based system on chip
-
C.A. Papachristou, F. Martin, and M. Nourani, "Microprocessor based testing for core-based system on chip", in Proc. Design Automation Conference, 1999, pp. 586-591
-
(1999)
Proc. Design Automation Conference
, pp. 586-591
-
-
Papachristou, C.A.1
Martin, F.2
Nourani, M.3
-
6
-
-
0033307908
-
Testing a system-on-a-chip with embedded microprocessor
-
Oct.
-
R. Rajsuman, "Testing a System-On-a-Chip with Embedded Microprocessor", in Proc. International Test Conference, Oct. 1999, pp. 499-508
-
(1999)
Proc. International Test Conference
, pp. 499-508
-
-
Rajsuman, R.1
-
7
-
-
0006642848
-
Processor-programmable memory BIST for bus-connected embedded memories
-
C.-H. Tsai, C.-W. Wu, "Processor-Programmable Memory BIST for Bus-Connected Embedded Memories", in Proc. of the ASP-DAC 2001, Asia and South Pacific Design Automation Conference, 2001, pp. 325-330
-
(2001)
Proc. of the ASP-DAC 2001, Asia and South Pacific Design Automation Conference
, pp. 325-330
-
-
Tsai, C.-H.1
Wu, C.-W.2
-
11
-
-
0031222489
-
A variance-reduction technique via fault-expansion for fault-coverage estimation
-
Sept.
-
D.T. Smith, B.W. Johnson, N. Andrianos, J.A. Profeta, "A variance-reduction technique via fault-expansion for fault-coverage estimation" IEEE Transactions on Reliability, Vol. 46, N. 3, Sept. 1997, pp. 366-374
-
(1997)
IEEE Transactions on Reliability
, vol.46
, Issue.3
, pp. 366-374
-
-
Smith, D.T.1
Johnson, B.W.2
Andrianos, N.3
Profeta, J.A.4
-
12
-
-
0033316969
-
Towards a standard for embedded core test: An example
-
E.J. Marinissen, Y. Zorian, R. Kapur, T. Taylor, L. Whetsel, "Towards a Standard for Embedded Core Test: An Example", IEEE International Test Conference, 1999, pp. 616-627
-
(1999)
IEEE International Test Conference
, pp. 616-627
-
-
Marinissen, E.J.1
Zorian, Y.2
Kapur, R.3
Taylor, T.4
Whetsel, L.5
-
13
-
-
84925405668
-
Low density parity check codes
-
R.G. Gallagher,"Low Density Parity Check Codes", IEEE Transaction on Information Theory, Vol. 8, N. 1, 1962, pp. 21-28
-
(1962)
IEEE Transaction on Information Theory
, vol.8
, Issue.1
, pp. 21-28
-
-
Gallagher, R.G.1
-
14
-
-
0033099611
-
Correcting codes based on very spares matrices
-
March
-
D.J. MacKay, "Correcting Codes Based on Very Spares Matrices", IEEE Transaction on Information Theory, Vol. 45, N. 2, March 1999, pp. 399-431
-
(1999)
IEEE Transaction on Information Theory
, vol.45
, Issue.2
, pp. 399-431
-
-
MacKay, D.J.1
-
15
-
-
33646912049
-
Reconfigurable serial LDPC decoder architecture
-
CERCOM, May
-
G. Masera, F. Quaglio, "Reconfigurable Serial LDPC Decoder Architecture", PRIMO technical Internal Report, CERCOM, N.1, May 2004
-
(2004)
PRIMO Technical Internal Report
, Issue.1
-
-
Masera, G.1
Quaglio, F.2
-
16
-
-
33646927114
-
GARDA: A diagnostic ATPG for large synchronous sequential circuits
-
F. Corno, P. Prinetto, M. Rebaudengo, M. Sonza Reorda, "GARDA: a Diagnostic ATPG for Large Synchronous Sequential Circuits", ED&TC95: IEEE European Design and Test Conference, 1995
-
(1995)
ED&TC95: IEEE European Design and Test Conference
-
-
Corno, F.1
Prinetto, P.2
Rebaudengo, M.3
Reorda, M.S.4
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