-
1
-
-
0029352826
-
-
A. Kasukawa, N. Yakouchi, N. Yamanaka, N. Iwai, and T. Matsuda, Jpn. J. Appl. Phys. 34, L965 (1995).
-
(1995)
Jpn. J. Appl. Phys.
, vol.34
-
-
Kasukawa, A.1
Yakouchi, N.2
Yamanaka, N.3
Iwai, N.4
Matsuda, T.5
-
3
-
-
0029731460
-
-
X. B. Mei, K. K. Loi, H. H. Weider, W. S. C. Chang, and C. W. Tu, Appl. Phys. Lett. 68, 90 (1996).
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 90
-
-
Mei, X.B.1
Loi, K.K.2
Weider, H.H.3
Chang, W.S.C.4
Tu, C.W.5
-
4
-
-
0013000584
-
-
X. B. Mei, W. G. Bi, C. W. Tu, L. J. Chou, and K. C. Hsieh, J. Vac. Sci. Technol. B 14, 2327 (1996).
-
(1996)
J. Vac. Sci. Technol. B
, vol.14
, pp. 2327
-
-
Mei, X.B.1
Bi, W.G.2
Tu, C.W.3
Chou, L.J.4
Hsieh, K.C.5
-
5
-
-
0342891362
-
-
T. H. Chiu, J. E. Cunningham, T. K. Woodward, and T. I. Sizer, Appl. Phys. Lett. 62, 340 (1993).
-
(1993)
Appl. Phys. Lett.
, vol.62
, pp. 340
-
-
Chiu, T.H.1
Cunningham, J.E.2
Woodward, T.K.3
Sizer, T.I.4
-
8
-
-
3943053891
-
-
W. J. Scaff, P. J. Tasker, M. C. Foisy, and L. F. Eastman, Semicond. Semimet. 33, 73 (1991).
-
(1991)
Semicond. Semimet.
, vol.33
, pp. 73
-
-
Scaff, W.J.1
Tasker, P.J.2
Foisy, M.C.3
Eastman, L.F.4
-
9
-
-
85033183752
-
-
Ph.D. dissertation, École Polytechnique de Montréal
-
Y. Ababou, Ph.D. dissertation, École Polytechnique de Montréal, 1996.
-
(1996)
-
-
Ababou, Y.1
-
10
-
-
0023042985
-
-
R. Hull, J. C. Bean, F. Cerdeira, A. T. Fiory, and J. M. Gibson, Appl. Phys. Lett. 48, 56 (1986).
-
(1986)
Appl. Phys. Lett.
, vol.48
, pp. 56
-
-
Hull, R.1
Bean, J.C.2
Cerdeira, F.3
Fiory, A.T.4
Gibson, J.M.5
-
11
-
-
30244475226
-
-
A. D. Smith, A. T. R. Briggs, K. Scarrott, X. Zhou, and U. Bangert, Appl. Phys. Lett. 65, 2311 (1994).
-
(1994)
Appl. Phys. Lett.
, vol.65
, pp. 2311
-
-
Smith, A.D.1
Briggs, A.T.R.2
Scarrott, K.3
Zhou, X.4
Bangert, U.5
-
12
-
-
0029340896
-
-
U. Bangert, A. J. Harvey, C. Dieker, and H. Hardtdegen, J. Cryst. Growth 152, 115 (1995).
-
(1995)
J. Cryst. Growth
, vol.152
, pp. 115
-
-
Bangert, U.1
Harvey, A.J.2
Dieker, C.3
Hardtdegen, H.4
-
13
-
-
0038386815
-
-
U. Bangert, A. J. Harvey, C. Dieker, and H. Hardtdegen, Appl. Phys. Lett. 69, 2101 (1996).
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 2101
-
-
Bangert, U.1
Harvey, A.J.2
Dieker, C.3
Hardtdegen, H.4
-
14
-
-
21544441670
-
-
A. Ponchet, A. Rocher, J.-Y. Emery, C. Strarck, and L. Goldstein, J. Appl. Phys. 74, 3778 (1993).
-
(1993)
J. Appl. Phys.
, vol.74
, pp. 3778
-
-
Ponchet, A.1
Rocher, A.2
Emery, J.-Y.3
Strarck, C.4
Goldstein, L.5
-
15
-
-
3943064779
-
-
A. Ponchet, A. Rocher, J. Y. Emery, C. Starck, and L. Goldstein, Inst. Phys. Conf. Ser. 134, 485 (1993).
-
(1993)
Inst. Phys. Conf. Ser.
, vol.134
, pp. 485
-
-
Ponchet, A.1
Rocher, A.2
Emery, J.Y.3
Starck, C.4
Goldstein, L.5
-
16
-
-
36449005873
-
-
A. Ponchet, A. Rocher, J.-Y. Emery, C. Starck, and L. Goldstein, J. Appl. Phys. 77, 1977 (1995).
-
(1995)
J. Appl. Phys.
, vol.77
, pp. 1977
-
-
Ponchet, A.1
Rocher, A.2
Emery, J.-Y.3
Starck, C.4
Goldstein, L.5
-
17
-
-
36449002035
-
-
A. Ponchet, A. Rocher, A. Ougazzaden, and A. Mircea, J. Appl. Phys. 75, 7881 (1994).
-
(1994)
J. Appl. Phys.
, vol.75
, pp. 7881
-
-
Ponchet, A.1
Rocher, A.2
Ougazzaden, A.3
Mircea, A.4
-
18
-
-
0000067621
-
-
W. K. Burton, N. Cabrera, and F. C. Frank, Philos. Trans. R. Soc. London, Ser. A 243, 299 (1951).
-
(1951)
Philos. Trans. R. Soc. London, Ser. A
, vol.243
, pp. 299
-
-
Burton, W.K.1
Cabrera, N.2
Frank, F.C.3
-
19
-
-
0000910570
-
-
U. Bangert, A. J. Harvey, C. Dieker, H. Hartdegan, L. Vescan, and A. Smith, J. Appl. Phys. 78, 811 (1995).
-
(1995)
J. Appl. Phys.
, vol.78
, pp. 811
-
-
Bangert, U.1
Harvey, A.J.2
Dieker, C.3
Hartdegan, H.4
Vescan, L.5
Smith, A.6
-
22
-
-
85033182706
-
-
Y. Ababou, P. Desjardins, A. Chennouf, R. A. Masut, A. Yelon, M. Beaudoin, A. Bensaada, R. Leonelli, and G. L'Espérance, Semicond. Sci. Technol. (in press).
-
Semicond. Sci. Technol. (in Press)
-
-
Ababou, Y.1
Desjardins, P.2
Chennouf, A.3
Masut, R.A.4
Yelon, A.5
Beaudoin, M.6
Bensaada, A.7
Leonelli, R.8
L'Espérance, G.9
-
23
-
-
0346427759
-
-
P. Cova, R. A. Masut, J. F. Curie, A. Bensaada, R. Leonelli, and C. A. Tran. Can. J. Phys. 69, 412 (1991).
-
(1991)
Can. J. Phys.
, vol.69
, pp. 412
-
-
Cova, P.1
Masut, R.A.2
Curie, J.F.3
Bensaada, A.4
Leonelli, R.5
Tran, C.A.6
-
24
-
-
85033164184
-
-
note
-
The low and high exit angle geometries provide the same structural information. However, the low-exit angle configuration, in addition to being more surface sensitive, provides additional practical advantages, including a smaller irradiated area, thus facilitated sample positioning and an experimental geometry that is less sensitive to the diffractiometer alignment.
-
-
-
-
28
-
-
0001379382
-
-
M. Beaudoin, A. Bensaada, R. Leonelli, P. Desjardins, R. A. Masut, L. Ismard, A. Chennouf, and G. L'Espérance, Phys. Rev. B 53, 1990 (1996).
-
(1996)
Phys. Rev. B
, vol.53
, pp. 1990
-
-
Beaudoin, M.1
Bensaada, A.2
Leonelli, R.3
Desjardins, P.4
Masut, R.A.5
Ismard, L.6
Chennouf, A.7
L'Espérance, G.8
-
29
-
-
85033175242
-
-
note
-
Since the 0th-order superlattice peak and the substrate peak almost coincide for strain-compensated structures, the determination of the in-plane relaxation from the asymmetric 115 ω-2θ curves is nearly impossible. RLM is therefore essential to quantify the strain relaxation of these structures.
-
-
-
-
30
-
-
85033172719
-
-
note
-
The high exit angle geometry has been used because we measured almost no intensity for the film using the 224 reflection which has a higher surface sensitivity.
-
-
-
-
32
-
-
0000623705
-
-
P. M. Mooney, F. K. LeGoues, J. Tersoff, and J. O. Chu, J. Appl. Phys. 75, 3968 (1994).
-
(1994)
J. Appl. Phys.
, vol.75
, pp. 3968
-
-
Mooney, P.M.1
LeGoues, F.K.2
Tersoff, J.3
Chu, J.O.4
-
33
-
-
0028251755
-
-
H. Heinke, M. O. Möller, D. Hommel, and G. Landwehr, J. Cryst. Growth 135, 41 (1994).
-
(1994)
J. Cryst. Growth
, vol.135
, pp. 41
-
-
Heinke, H.1
Möller, M.O.2
Hommel, D.3
Landwehr, G.4
-
34
-
-
0042871703
-
-
D. E. Jesson, K. M. Chen, S. J. Pennycook, T. Thundat, and R. J. Warmack, Science 256, 1161 (1995).
-
(1995)
Science
, vol.256
, pp. 1161
-
-
Jesson, D.E.1
Chen, K.M.2
Pennycook, S.J.3
Thundat, T.4
Warmack, R.J.5
-
37
-
-
0342708883
-
-
Y. H. Xie, G. H. Gilmer, C. Roland, P. J. Silverman, S. K. Buratto, J. Y. Cheng, E. A. Fitzgerald, A. R. Kortan, S. Schuppler, M. A. Marcus, and P. H. Citrin, Phys. Rev. Lett. 73, 3006 (1994).
-
(1994)
Phys. Rev. Lett.
, vol.73
, pp. 3006
-
-
Xie, Y.H.1
Gilmer, G.H.2
Roland, C.3
Silverman, P.J.4
Buratto, S.K.5
Cheng, J.Y.6
Fitzgerald, E.A.7
Kortan, A.R.8
Schuppler, S.9
Marcus, M.A.10
Citrin, P.H.11
-
39
-
-
0342386444
-
-
M. A. Cotta, R. A. Hamm, S. N. G. Chu, L. R. Harriott, and H. Temkin, J. Appl. Phys. 75, 630 (1994).
-
(1994)
J. Appl. Phys.
, vol.75
, pp. 630
-
-
Cotta, M.A.1
Hamm, R.A.2
Chu, S.N.G.3
Harriott, L.R.4
Temkin, H.5
-
40
-
-
33744696049
-
-
S. T. Chou, K. Y. Cheng, L. J. Chou, and K. C. Hsieh, J. Appl. Phys. 78, 6270 (1995).
-
(1995)
J. Appl. Phys.
, vol.78
, pp. 6270
-
-
Chou, S.T.1
Cheng, K.Y.2
Chou, L.J.3
Hsieh, K.C.4
|