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Volumn 134, Issue 1, 2006, Pages 20-26

Ga-doped ZnO thin films: Effect of deposition temperature, dopant concentration, and vacuum-thermal treatment on the electrical, optical, structural and morphological properties

Author keywords

Semiconductor oxide; Spray pyrolysis; Thin films; Vacuum annealing treatment; Zinc oxide

Indexed keywords

ANNEALING; DEPOSITION; DOPING (ADDITIVES); GALLIUM; HALL EFFECT; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; VACUUM APPLICATIONS; X RAY DIFFRACTION; ZINC OXIDE;

EID: 33749236387     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2006.07.039     Document Type: Review
Times cited : (77)

References (23)
  • 17
    • 85165515464 scopus 로고    scopus 로고
    • M. de la L. Olvera, Ph. D. Thesis, CINVESTAV-IPN, México, 1998.
  • 21
  • 22
    • 85165477447 scopus 로고    scopus 로고
    • Powder Diffraction File, Data Card 5-644, 3c PDS International Center for Diffraction Data, Swartmore, PA.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.