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Volumn 79, Issue 2, 2001, Pages 215-217

Formation mechanism of V defects in the InGaN/GaN multiple quantum wells grown on GaN layers with low threading dislocation density

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Indexed keywords


EID: 0035832906     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1384906     Document Type: Article
Times cited : (173)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.