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Volumn 182, Issue 10, 2009, Pages 2620-2625
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The influence of A-site rare-earth for barium substitution on the chemical structure and ferroelectric properties of BZT thin films
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Author keywords
BZT; Ferroelectrics; Magnetron sputtering; Perovskites; Thin films
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Indexed keywords
BZT;
BZT THIN FILMS;
CHEMICAL STRUCTURE;
CRYSTALLINE FILMS;
ELECTRIC FIELD HYSTERESIS LOOP;
FERROELECTRIC BEHAVIOR;
FERROELECTRIC PROPERTY;
FERROELECTRICS;
HIGH OXYGEN PRESSURE;
IN-DEPTH PROFILE;
LANTHANIDE ION;
LOWER ENERGIES;
MICRON SIZE;
NB-DOPED SRTIO;
NON-DOPED;
PEROVSKITE STRUCTURES;
PREFERRED ORIENTATIONS;
REMANENT POLARIZATION;
RF-MAGNETRON SPUTTERING;
SEM;
SI SUBSTRATES;
SINGLE-CRYSTAL SI;
SPIN-ORBITALS;
SUBSTRATE TEMPERATURE;
TEM;
XPS ANALYSIS;
BARIUM;
BARIUM COMPOUNDS;
CRYSTAL ORIENTATION;
ELECTRIC FIELDS;
ELECTRON PROBE MICROANALYSIS;
ELECTRONS;
EPITAXIAL FILMS;
EPITAXIAL GROWTH;
FERROELECTRIC FILMS;
FERROELECTRICITY;
FILM GROWTH;
GRAIN BOUNDARIES;
HYSTERESIS;
HYSTERESIS LOOPS;
MAGNETRONS;
NIOBIUM;
OXIDE MINERALS;
OXYGEN;
PEROVSKITE;
PHOTOIONIZATION;
PHOTONS;
PLATINUM;
POLARIZATION;
RARE EARTH ELEMENTS;
SCANNING ELECTRON MICROSCOPY;
SILICON;
SPACE PROBES;
SUBSTRATES;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
ZIRCONIUM;
X RAY PHOTOELECTRON SPECTROSCOPY;
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EID: 70349495478
PISSN: 00224596
EISSN: 1095726X
Source Type: Journal
DOI: 10.1016/j.jssc.2009.07.013 Document Type: Article |
Times cited : (18)
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References (29)
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