Nanobits: Customizable scanning probe tips

Nanotechnology

Volumn 20, Issue 39, 2009, Pages

  Rajendra Kumar, R T ^a   Hassan, S U ^a   Sardan Sukas, O ^a   Eichhorn, V ^b   Krohs, F ^b   Fatikow, S ^b   Boggild, P ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b UNIVERSITY OF OLDENBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AFM PROBE; CUSTOMIZABLE; DEEP TRENCH; MICROGRIPPER; NANOBITS; NANOMANIPULATIONS; NARROW SLITS; PROOF OF PRINCIPLES; SCANNING PROBES; SHAPE AND SIZE; SILICON PROCESSING; SURFACE TOPOLOGY;

ELECTRON BEAMS; PROBES; SCANNING; SILICON COMPOUNDS; SILICON OXIDES;

ATOMIC FORCE MICROSCOPY;

NANOMATERIAL; SILICON DIOXIDE; SILICON NITRIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRON BEAM; MOLECULAR MECHANICS; MOLECULAR PROBE; NANOTECHNOLOGY; PRIORITY JOURNAL; SCANNING PROBE MICROSCOPY;

EID: 70349083761     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/39/395703     Document Type: Article

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