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Volumn 8, Issue 6, 1997, Pages 355-368
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Fabrication of nano-tips by carbon contamination in a scanning electron microscope for use in scanning probe microscopy and field emission
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001762973
PISSN: 11542799
EISSN: None
Source Type: Journal
DOI: 10.1051/mmm:1997127 Document Type: Article |
Times cited : (24)
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References (12)
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