Effect of film thickness on ferroelectric domain structure and properties of Pb(Zr0.35Ti0.65)O3/SrRuO3/ SrTiO3 heterostructures

Journal of Materials Science

Volumn 44, Issue 19, 2009, Pages 5318-5324

  Morioka, Hitoshi ^a   Saito, Keisuke ^a   Yokoyama, Shintaro ^b   Oikawa, Takahiro ^b   Kurosawa, Toshiyuki ^a   Funakubo, Hiroshi ^b  

^a BRUKER AXS INC   (United States)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED ELECTRIC FIELD; DIELECTRIC AND FERROELECTRIC PROPERTIES; DOMAIN STRUCTURE; EPITAXIAL PZT; FERROELECTRIC DOMAIN STRUCTURE; FERROELECTRIC POLARIZATION; HETEROSTRUCTURES; HIGH RESOLUTION X RAY DIFFRACTION; METALORGANIC CHEMICAL VAPOR DEPOSITION; POLYDOMAIN STRUCTURES; PZT; RECIPROCAL SPACE MAPPING; REMANENT POLARIZATION; SRTIO; TETRAGONAL SYMMETRIES; THICK EPITAXIAL FILMS;

CRYSTALS; ELECTRIC FIELDS; FERROELECTRIC FILMS; FERROELECTRICITY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LEAD; LEAD ALLOYS; MAGNETIC FILMS; MOLECULAR BEAM EPITAXY; PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC MATERIALS; PIEZOELECTRIC TRANSDUCERS; POLARIZATION; SEMICONDUCTING LEAD COMPOUNDS; STRONTIUM ALLOYS; TITRATION; X RAY DIFFRACTION ANALYSIS; ZIRCONIUM;

EPITAXIAL FILMS;

EID: 68949167780     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-009-3606-5     Document Type: Article

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