Composition and orientation dependence of electrical properties of epitaxial Pb(ZrxTi1-x)O3 thin films grown using metalorganic chemical vapor deposition

Journal of Applied Physics

Volumn 95, Issue 6, 2004, Pages 3111-3115

  Oikawa, Takahiro ^a   Aratani, Masanori ^a   Funakubo, Hiroshi ^a   Saito, Keisuke ^b   Mizuhira, Manabu ^b  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b PANalytical   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; ELECTRIC FIELD EFFECTS; ELECTRON BEAMS; EPITAXIAL GROWTH; FILM GROWTH; LEAD COMPOUNDS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; SINGLE CRYSTALS; SPUTTER DEPOSITION; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION ANALYSIS;

FILM ORIENTATION; HYSTERESIS LOOPS;

THIN FILMS;

EID: 1842427273     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1645646     Document Type: Article

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