Thickness-dependent threshold voltage in polycrystalline pentacene-based thin-film transistors

Solid-State Electronics

Volumn 53, Issue 10, 2009, Pages 1107-1111

  Wang, Yu Wu ^a   Cheng, Horng Long ^b  

^a NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

^b NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Electrical properties and measurements; Electronic devices; Organic semiconductors

Indexed keywords

ANALYTICAL MODEL; BULK TRAPS; CAPACITANCE VOLTAGE MEASUREMENTS; CONSTANT-CURRENT; CONTACT ELECTRODES; DIFFERENT THICKNESS; ELECTRICAL PROPERTIES AND MEASUREMENTS; ELECTRONIC DEVICES; EXPERIMENTAL DATA; MAXIMUM TRANSCONDUCTANCE; ORDERS OF MAGNITUDE; ORGANIC SEMICONDUCTORS; ORGANIC THIN FILM TRANSISTORS; PENTACENE FILM; PENTACENE THICKNESS; PENTACENES; POLYCRYSTALLINE PENTACENE; SPACE CHARGES; SQUARE-ROOT; TRAP DENSITY; TRAPPING CENTERS; TRAPPING EFFECTS;

CHARGE TRAPPING; ELECTRIC PROPERTIES; LAWS AND LEGISLATION; ORGANIC LIGHT EMITTING DIODES (OLED); SEMICONDUCTING ORGANIC COMPOUNDS; THERMOELECTRIC EQUIPMENT; THIN FILM DEVICES; THIN FILM TRANSISTORS; THRESHOLD VOLTAGE; TRANSISTORS;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 68349128670     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2009.05.003     Document Type: Article

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