Influence of measuring environment on the electrical characteristics of pentacene-based thin film transistors

Thin Solid Films

Volumn 467, Issue 1-2, 2004, Pages 215-219

  Wang, Yu Wu ^a,b   Cheng, Horng Long ^b,c   Wang, Yi Kai ^a,b   Hu, Tang Hsiang ^b   Ho, Jia Chong ^b   Lee, Cheng Chung ^b   Lei, Tan Fu ^a   Yeh, Ching Fa ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

^c NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Electrical properties and measurements; Electronic devices; Organic semiconductors

Indexed keywords

ELECTRICAL PROPERTIES AND MEASUREMENTS; ELECTRONIC DEVICES; GATE VOLTAGES; PENTACENE;

ATOMIC FORCE MICROSCOPY; CARRIER MOBILITY; ELECTRIC FIELDS; GRAIN BOUNDARIES; OPTOELECTRONIC DEVICES; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; POLYSILICON; SEMICONDUCTING ORGANIC COMPOUNDS; TRANSCONDUCTANCE; TRANSPORT PROPERTIES;

THIN FILM TRANSISTORS;

EID: 4444320078     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.04.001     Document Type: Article

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