Application of the josephson effect to voltage metrology

Proceedings of the IEEE

Volumn 92, Issue 10, 2004, Pages 1617-1625

  Benz, Samuel P ^a   Hamilton, Clark A ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b VMetrix LLC   (United States)

Author keywords

Digital analog conversion; Josephson arrays; Quantization; Standards

Indexed keywords

DIGITAL TO ANALOG CONVERSION; ELECTRIC CURRENTS; ELECTROCHEMISTRY; FOURIER TRANSFORMS; MAGNETIC FLUX; NATURAL FREQUENCIES; OSCILLATIONS; STANDARDS; TUNNEL JUNCTIONS; VOLTAGE MEASUREMENT;

ELECTROMOTIVE FORCE; JOSEPHSON ARRAYS; QUANTIZATION; THERMAL ENGINEERING;

JOSEPHSON JUNCTION DEVICES;

EID: 21244460299     PISSN: 00189219     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPROC.2004.833671     Document Type: Conference Paper

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