Precision sampling measurements using ac programmable Josephson voltage standards

Review of Scientific Instruments

Volumn 79, Issue 4, 2008, Pages

  Rufenacht A ^a   Burroughs, C J ^a   Benz, S P ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

JOSEPHSON JUNCTION DEVICES; SIGNAL ANALYSIS; STANDARDS; VOLTMETERS; WAVEFORM ANALYSIS;

DIFFERENTIAL SAMPLING METHOD; JOSEPHSON WAVEFORMS; PROGRAMMABLE JOSEPHSON VOLTAGE STANDARDS;

ELECTRIC VARIABLES MEASUREMENT;

EID: 42949143750     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2901683     Document Type: Article

References (16)

1. S. P. Benz and C. A. Hamilton, Proc. IEEE 92, 1617 (2004).
2. S. P. Benz, C. J. Burroughs, P. D. Dresselhaus, N. F. Bergren, T. E. Lipe, J. R. Kinard, and Y. H. Tang, IEEE Trans. Instrum. Meas. 56, 239 (2007).
3. C. A. Hamilton, C. J. Burroughs, and R. L. Kautz, IEEE Trans. Instrum. Meas. 44, 223 (1995).
4. R. Behr, J. M. Williams, P. Patel, T. J. B. M. Janssen, T. Funck, and M. Klonz, IEEE Trans. Instrum. Meas. 54, 612 (2005).
5. R. Behr, L. Palafox, J. Schurr, J. M. Williams, and J. Melcher, in Proc. of the 6th International Seminar in Electrical Metrology, 21-23 September, 2005, Rio de Janeiro, Brazil (unpublished), pp. 11-12.
6. C. J. Burroughs, S. P. Benz, P. D. Dresselhaus, B. C. Waltrip, T. L. Nelson, Y. Chong, J. M. Williams, D. Henderson, P. Patel, L. Palafox, and R. Behr, IEEE Trans. Instrum. Meas. 56, 289 (2007).
7. L. Palafox, G. Ramm, R. Behr, W. G. K. Ihlenfeld, and H. Moser, IEEE Trans. Instrum. Meas. 56, 534 (2007).
8. C. J. Burroughs, A. Rufenacht, S. P. Benz, P. D. Dresselhaus, B. C. Waltrip, and T. L. Nelson, in Proc. of the National Conference of Standards Laboratories International, Jul. 30-Aug. 2, 2007, St. Paul, Minnesota (unpublished); " Error and Transient Analysis of Stepwise-Approximated Sine Waves Generated by Programmable Josephson Voltage Standards.," IEEE Trans. Instrum. Meas. (to be published).
9. W. G. Kürten Ihlenfeld, E. Mohns, R. Behr, J. M. Williams, G. Ramm, and H. Bachmair, IEEE Trans. Instrum. Meas. 54, 612 (2005).
10. R. Behr, L. Palafox, G. Ramm, H. Moser, and J. Melcher, IEEE Trans. Instrum. Meas. 56, 235 (2007).
11. C. J. Burroughs, P. D. Dresselhaus, Y. Chong, and H. Yamamori, IEEE Trans. Appl. Supercond. 15, 465 (2005).
12. Y. Chong, C. J. Burrouhs, P. D. Dresselhaus, N. Hadacek, H. Yamamori, and S. P. Benz, IEEE Trans. Appl. Supercond. 15, 461 (2005).
13. C. J. Burroughs, S. P. Benz, T. E. Harvey, and C. A. Hamilton, IEEE Trans. Appl. Supercond. 9, 4145 (1999).
14. W. C. Goecke, Hewlett-Packard J. 40, 8 (1989).
15. H. E. van den Brom, E. Houtzager, G. Rietveld, R. van Bemmelen, and O. Chevtchenko, Meas. Sci. Technol. 18, 3316 (2007).
16. P. Kleinschmidt, P. D. Patel, J. M. Williams, and T. J. B. M. Janssen, Cytokine Growth Factor Rev. 149, 313 (2002).