Recent developments in BIPM voltage standard comparisons

IEEE Transactions on Instrumentation and Measurement

Volumn 50, Issue 2, 2001, Pages 206-209

  Reymann, Dominique ^b   Witt, Thomas J ^a,b   Vrabček, Peter ^c   Tang, Yi Hua ^d   Hamilton, Clark A ^a,d   Katkov, Alexander S ^e   Jeanneret, Blaise ^f   Power, Oliver ^g  

^a IEEE

^b PAVILLON DE BRETEUIL   (France)

^c SLOVAK INSTITUTE OF METROLOGY   (Slovakia)

^d NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^e D I MENDELEYEV INSTITUTE FOR METROLOGY   (Russian Federation)

^f Swiss Federal Office of Metrology   (Switzerland)

^g National Metrology Laboratory   (Ireland)

Author keywords

Author; E mail keywords@ieee.org for info.; Please supply index terms

Indexed keywords

CALIBRATION; ELECTRIC POTENTIAL; STANDARDS; VOLTAGE MEASUREMENT; VOLTMETERS; ZENER DIODES;

JOSEPHSON STANDARDS; ZENER VOLTAGE STANDARDS;

JOSEPHSON JUNCTION DEVICES;

EID: 0035307839     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.918103     Document Type: Article

References (9)