NIST comparison of the quantized Hall resistance and the realization of the SI ohm through the calculable capacitor

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 2, 1997, Pages 264-268

  Jeffery, Anne Marie ^a,b   Elmquist, R E ^a,b   Lee, Lai H ^b   Shields, John Q ^b   Dziuba, R F ^a,b  

^a IEEE   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; ELECTRIC MEASURING INSTRUMENTS; HALL EFFECT; MEASUREMENT ERRORS;

CALCULABLE CAPACITORS; QUANTIZED HALL RESISTANCE (QHR);

ELECTRIC RESISTANCE MEASUREMENT;

EID: 0031117858     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.571828     Document Type: Article

References (10)

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