Programmable Josephson voltage standard circuits using arrays of NbN/TiN/NbN/TiN/NbN double-junction stacks operated at 10 K

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 2, 2005, Pages 620-623

  Ishizaki, Mayumi ^a   Yamamori, Hirotake ^a   Shoji, Akira ^a   Dresselhaus, Paul D ^b   Benz, Samuel P ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Double junction stack; Josephson junction; Microwave; Voltage standard

Indexed keywords

ARRAYS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; EQUIVALENT CIRCUITS; SEMICONDUCTOR JUNCTIONS; SEMICONDUCTOR MATERIALS; SILICON WAFERS; VOLTAGE MEASUREMENT; VOLTMETERS;

DOUBLE JUNCTION STACK; MICROWAVE BIAS; NANOVOLTMETER; PROGRAMMABLE JOSEPHSON VOLTAGE STANDARD CIRCUITS; VOLTAGE STANDARD;

JOSEPHSON JUNCTION DEVICES;

EID: 17444432538     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2004.843068     Document Type: Article

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