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Volumn 15, Issue 2 PART I, 2005, Pages 461-464

Practical high-resolution programmable josephson voltage standards using double- and triple-stacked MoSi2-barrier junctions

Author keywords

Josephson arrays; Programmable voltage standard; Superconducting integrated circuits; Superconductor normal superconductor devices

Indexed keywords

ELECTRIC POTENTIAL; INTEGRATED CIRCUITS; MICROPROCESSOR CHIPS; MICROWAVES; MOLYBDENUM COMPOUNDS; SEMICONDUCTOR JUNCTIONS; SUPERCONDUCTING DEVICES;

EID: 22044445693     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2005.849874     Document Type: Conference Paper
Times cited : (45)

References (18)
  • 2
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    • Superconductor-normal metal-superconductor process development for the fabrication of small Josephson junctions in ramp-type configuration
    • R. Pöppel, D. Hagedorn, T. Weimann, F.-I. Buchholz, and J. Niemeyer, "Superconductor-normal metal-superconductor process development for the fabrication of small Josephson junctions in ramp-type configuration," Supercond. Sci. Technol., vol. 13, pp. 148-153, 2000.
    • (2000) Supercond. Sci. Technol. , vol.13 , pp. 148-153
    • Pöppel, R.1    Hagedorn, D.2    Weimann, T.3    Buchholz, F.-I.4    Niemeyer, J.5
  • 5
    • 22044441512 scopus 로고    scopus 로고
    • note
    • x-Nb junction-based conventional 10-V voltage standard systems have been widely used in metrology labs for calibration purpose. However, these conventional systems are not fast-programmable, that is, the voltage steps cannot be quickly set to a desired value..
  • 6
    • 21244460299 scopus 로고    scopus 로고
    • Application of the Josephson effect to voltage metrology
    • Oct.
    • S. P. Benz and C. A. Hamilton, "Application of the Josephson effect to voltage metrology," Proc. IEEE, vol. 92, pp. 1617-1629, Oct. 2004.
    • (2004) Proc. IEEE , vol.92 , pp. 1617-1629
    • Benz, S.P.1    Hamilton, C.A.2
  • 7
    • 17444361846 scopus 로고    scopus 로고
    • Flatspot measurements for an AC Josephson voltage standard
    • Apr., to be published
    • C. J. Burroughs, S. P. Benz, P. D. Dresselhaus, and Y. Chong, "Flatspot measurements for an AC Josephson voltage standard," IEEE Trans. Instrum. Meas., vol. 54, no. 2, Apr. 2005, to be published.
    • (2005) IEEE Trans. Instrum. Meas. , vol.54 , Issue.2
    • Burroughs, C.J.1    Benz, S.P.2    Dresselhaus, P.D.3    Chong, Y.4
  • 8
    • 0035720942 scopus 로고    scopus 로고
    • Nanotechnology for next generation Josephson voltage standards
    • Dec.
    • S. P. Benz, P. D. Dresselhaus, and C. J. Burroughs, "Nanotechnology for next generation Josephson voltage standards," IEEE Trans. Instrum. Meas., vol. 50, pp. 1513-1518, Dec. 2001.
    • (2001) IEEE Trans. Instrum. Meas. , vol.50 , pp. 1513-1518
    • Benz, S.P.1    Dresselhaus, P.D.2    Burroughs, C.J.3
  • 9
    • 0041438773 scopus 로고    scopus 로고
    • Stacked SNS Josephson junction arrays for quantum voltage standards
    • Jun.
    • P. D. Dresselhaus, Y. Chong, J. H. Plantenberg, and S. P. Benz, "Stacked SNS Josephson junction arrays for quantum voltage standards," IEEE Trans. Appl. Supercond., vol. 13, no. 2, pp. 930-933, Jun. 2003.
    • (2003) IEEE Trans. Appl. Supercond. , vol.13 , Issue.2 , pp. 930-933
    • Dresselhaus, P.D.1    Chong, Y.2    Plantenberg, J.H.3    Benz, S.P.4
  • 13
    • 22044446257 scopus 로고    scopus 로고
    • Stacked SNS Josephson junctions for quantum voltage applications
    • Sydney, Australia, Jul.
    • P. D. Dresselhaus, Y. Chong, and S. P. Benz, "Stacked SNS Josephson junctions for quantum voltage applications," in Extended Abstract ISEC'03, Sydney, Australia, Jul. 2003.
    • (2003) Extended Abstract ISEC'03
    • Dresselhaus, P.D.1    Chong, Y.2    Benz, S.P.3
  • 18
    • 0141716799 scopus 로고    scopus 로고
    • Thermal transport in stacked superconductor-normal metal-superconductor Josephson junctions
    • Sep.
    • Y. Chong, P. D. Dresselhaus, and S. P. Benz, "Thermal transport in stacked superconductor-normal metal-superconductor Josephson junctions," Appl. Phys. Lett., vol. 83, pp. 1794-1796, Sep. 2003.
    • (2003) Appl. Phys. Lett. , vol.83 , pp. 1794-1796
    • Chong, Y.1    Dresselhaus, P.D.2    Benz, S.P.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.