메뉴 건너뛰기




Volumn 79, Issue 7, 2009, Pages

Stress effects on impurity solubility in crystalline materials: A general model and density-functional calculations for dopants in silicon

Author keywords

[No Author keywords available]

Indexed keywords


EID: 67649570466     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.79.073201     Document Type: Article
Times cited : (35)

References (35)
  • 2
    • 33846606342 scopus 로고    scopus 로고
    • Precipitation of crack tip hydrides in zirconium alloys
    • DOI 10.1016/j.jallcom.2006.09.034, PII S0925838806014459
    • Y. Kim, S. Ahn, and Y. Cheong, J. Alloys Compd. 429, 221 (2007). 10.1016/j.jallcom.2006.09.034 (Pubitemid 46186968)
    • (2007) Journal of Alloys and Compounds , vol.429 , Issue.1-2 , pp. 221-226
    • Kim, Y.S.1    Ahn, S.B.2    Cheong, Y.M.3
  • 4
    • 42749100375 scopus 로고    scopus 로고
    • 10.1103/PhysRevB.70.054517
    • H. Su, D. O. Welch, and Winnie Wong-Ng, Phys. Rev. B 70, 054517 (2004). 10.1103/PhysRevB.70.054517
    • (2004) Phys. Rev. B , vol.70 , pp. 054517
    • Su, H.1    Welch, D.O.2    Wong-Ng, W.3
  • 7
    • 84864196976 scopus 로고    scopus 로고
    • Simulation of Semiconductor Processes and Devices: SISPAD 2004 (unpublished), p.
    • M. Diebel, S. Chakravarthi, S. T. Dunham, and C. F. Machala, Simulation of Semiconductor Processes and Devices: SISPAD 2004 (unpublished), p. 37.
    • Diebel, M.1    Chakravarthi, S.2    Dunham, S.T.3    MacHala, C.F.4
  • 9
    • 40849142315 scopus 로고    scopus 로고
    • Increasing the equilibrium solubility of dopants in semiconductor multilayers and alloys
    • DOI 10.1103/PhysRevLett.100.105501
    • A. Höglund, O. Eriksson, C. W. M. Castleton, and S. Mirbt, Phys. Rev. Lett. 100, 105501 (2008). 10.1103/PhysRevLett.100.105501 (Pubitemid 351399096)
    • (2008) Physical Review Letters , vol.100 , Issue.10 , pp. 105501
    • Hoglund, A.1    Eriksson, O.2    Castleton, C.W.M.3    Mirbt, S.4
  • 13
    • 56349119958 scopus 로고    scopus 로고
    • 10.1103/PhysRevB.78.195303
    • C. Ahn and S. T. Dunham, Phys. Rev. B 78, 195303 (2008). 10.1103/PhysRevB.78.195303
    • (2008) Phys. Rev. B , vol.78 , pp. 195303
    • Ahn, C.1    Dunham, S.T.2
  • 15
  • 16
    • 84864185017 scopus 로고    scopus 로고
    • VASP the GUIDE
    • VASP the GUIDE, http://ms.mpi.univie.ac.at/vasp
  • 18
    • 0032121620 scopus 로고    scopus 로고
    • 10.1557/JMR.1998.0252
    • T. L. Aselage, J. Mater. Res. 13, 1786 (1998). 10.1557/JMR.1998.0252
    • (1998) J. Mater. Res. , vol.13 , pp. 1786
    • Aselage, T.L.1
  • 20
    • 0000711874 scopus 로고
    • 10.1103/PhysRevLett.61.1282
    • K. C. Pandey, Phys. Rev. Lett. 61, 1282 (1988). 10.1103/PhysRevLett.61. 1282
    • (1988) Phys. Rev. Lett. , vol.61 , pp. 1282
    • Pandey, K.C.1
  • 24
    • 36049053404 scopus 로고
    • 10.1103/RevModPhys.40.677
    • N. F. Mott, Rev. Mod. Phys. 40, 677 (1968). 10.1103/RevModPhys.40.677
    • (1968) Rev. Mod. Phys. , vol.40 , pp. 677
    • Mott, N.F.1
  • 26
    • 33845762895 scopus 로고    scopus 로고
    • A simulation model for the density of states and for incomplete ionization in crystalline silicon. I. Establishing the model in Si:P
    • DOI 10.1063/1.2386934
    • P. P. Altermatt, A. Schenk, and G. Heiser, J. Appl. Phys. 100, 113714 (2006). 10.1063/1.2386934 (Pubitemid 46012180)
    • (2006) Journal of Applied Physics , vol.100 , Issue.11 , pp. 113714
    • Altermatt, P.P.1    Schenk, A.2    Heiser, G.3
  • 27
    • 23244460838 scopus 로고
    • 10.1103/PhysRevB.46.6671
    • J. P. Perdew, Phys. Rev. B 46, 6671 (1992). 10.1103/PhysRevB.46.6671
    • (1992) Phys. Rev. B , vol.46 , pp. 6671
    • Perdew, J.P.1
  • 28
    • 0000198608 scopus 로고
    • 10.1103/PhysRevB.7.5212;
    • A. Baldereschi, Phys. Rev. B 7, 5212 (1973) 10.1103/PhysRevB.7.5212
    • (1973) Phys. Rev. B , vol.7 , pp. 5212
    • Baldereschi, A.1
  • 29
    • 12344328934 scopus 로고
    • 10.1103/PhysRevB.8.5747;
    • D. J. Chadi and M. L. Cohen, Phys. Rev. B 8, 5747 (1973) 10.1103/PhysRevB.8.5747
    • (1973) Phys. Rev. B , vol.8 , pp. 5747
    • Chadi, D.J.1    Cohen, M.L.2
  • 30
  • 34
    • 5444231545 scopus 로고    scopus 로고
    • 10.1088/0268-1242/19/10/002
    • L. Yang, Semicond. Sci. Technol. 19, 1174 (2004). 10.1088/0268-1242/19/ 10/002
    • (2004) Semicond. Sci. Technol. , vol.19 , pp. 1174
    • Yang, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.