Atomic-resolution STEM in the aberration-corrected JEOL JEM2200FS

Microscopy and Microanalysis

Volumn 14, Issue 1, 2008, Pages 104-112

  Klie, Robert F ^a,b   Johnson, Craig ^a   Zhu, Yimei ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

Author keywords

Aberration correction; EELS; STEM; TEM

Indexed keywords

GERMANIUM; GOLD;

CONFERENCE PAPER; IMAGE ENHANCEMENT; INSTRUMENTATION; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SENSITIVITY AND SPECIFICITY;

GERMANIUM; GOLD; IMAGE ENHANCEMENT; MICROSCOPY, ELECTRON, SCANNING TRANSMISSION; SENSITIVITY AND SPECIFICITY;

EID: 38349105031     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608080136     Document Type: Conference Paper

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