Position-sensitive diffractive imaging in STEM by an automated chaining diffraction algorithm

Ultramicroscopy

Volumn 108, Issue 8, 2008, Pages 741-749

  Volkov, V V ^a   Wall, J ^a   Zhu, Y ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

Diffractive imaging; Exit wave retrieval; High resolution imaging; Magnetic imaging; Non periodic and disordered objects; Sub Angstr m resolution

Indexed keywords

ABSORPTION; ALGORITHMS; BOOLEAN FUNCTIONS; CHARGED PARTICLES; CHEMICAL MODIFICATION; CONFORMAL MAPPING; DIFFRACTION; ELECTRON DIFFRACTION; ELECTRONS; EVOLUTIONARY ALGORITHMS; INTEGER PROGRAMMING; MAGNETIC PROPERTIES; MICROSCOPES; OPTICS; PERIODIC STRUCTURES; PIGMENTS; SCHEDULING ALGORITHMS; WAVE FUNCTIONS; WAVES;

(PL) PROPERTIES; APPLIED (CO); AUTOMATIC RECOVERY; COMPLEX STRUCTURES; DIFFERENT LENGTH SCALES; DIFFRACTION-LIMITED RESOLUTION; DIFFRACTIVE IMAGING; ELSEVIER (CO); FINITE SIZE; FUNCTIONAL MATERIALS; GENERAL (CO); INPUT/OUTPUT (I/O); MAGNETIC (CE); NEUTRON MICROSCOPY; OVERLAPPING REGIONS; PERIODIC OBJECTS; POSITION SENSITIVE; QUANTITATIVE ANALYSIS; RETRIEVAL (MIR); SCATTERING MECHANISMS; SELECTED AREA ELECTRON DIFFRACTION (SAED); TO MANY; WAVE AMPLITUDES; WIDE-FIELD; X-RAY MICROSCOPY (XRM);

FUNCTION EVALUATION;

AMPLITUDE MODULATION; ARTICLE; ELECTRON DIFFRACTION; IMAGE ANALYSIS; IMAGE ENHANCEMENT; IMAGE PROCESSING; IMAGE QUALITY; IMAGE RETRIEVAL; MAGNETIC FIELD; QUANTITATIVE ANALYSIS; SCANNING ELECTRON MICROSCOPY; SMALL ANGLE SCATTERING; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

EID: 45449118537     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.11.007     Document Type: Article

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