Uranium single atom imaging and EELS mapping using aberration corrected scanning transmission electron microscope and LN2 cold stage

Microscopy and Microanalysis

Volumn 14, Issue SUPPL. 2, 2008, Pages 1386-1387

  Inada, H ^a   Wall, J ^b   Zhu, Y ^b   Volkov, V ^b   Nakamura, K ^c   Konno, M ^c   Jarausch, K ^a  

^a Hitachi High Technologies America   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c HITACHI HIGH TECHNOLOGIES CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 49549116423     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608084171     Document Type: Conference Paper

References (3)

1. A.V. Crewe, J.S. Wall, & J. Langmore, Visibility of single atoms. Science 168, 1338, (1970).
2. P. E. Batson, N. Dellby & O. L. Krivanek. Sub-ångstrom resolution using aberration corrected electron optics, Nature 418, 617 (2002).
3. Supported by US Department of Energy BES, under contract No. DE-AC02-98CH10886.