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Volumn , Issue , 2008, Pages

The test features of the quad-core AMD opteron™ Microprocessor

Author keywords

[No Author keywords available]

Indexed keywords

AMD OPTERON; DESIGN FOR TEST; OPTERON;

EID: 67249101552     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2008.4700551     Document Type: Conference Paper
Times cited : (15)

References (17)
  • 4
    • 67249123367 scopus 로고    scopus 로고
    • At-speed launch and capture into the shadow logic of embedded memories
    • Irby, J., "At-speed Launch and Capture into the Shadow Logic of Embedded Memories", Submitted to ITC 2008.
    • Submitted to ITC 2008
    • Irby, J.1
  • 10
    • 0033342555 scopus 로고    scopus 로고
    • Test and debug features of the AMD-K7™ microprocessor
    • Wood, T., "Test and debug features of the AMDK7TM Microprocessor", Proc. International Test Conference, 1999, pp. 130-136.
    • (1999) Proc. International Test Conference , pp. 130-136
    • Wood, T.1
  • 11
  • 13
    • 0031358774 scopus 로고    scopus 로고
    • ScanA case study of the test development for the 2nd generation ColdFire® microprocessors
    • Nov.
    • Amason, D., Crouch, A. L., Eisele, R. Giles, G., Mateja, M., "ScanA case study of the test development for the 2nd generation ColdFire® microprocessors", Proc. International Test Conference, Nov. 1997, pp. 424-432.
    • (1997) Proc. International Test Conference , pp. 424-432
    • Amason, D.1    Crouch, A.L.2    Eisele, R.3    Giles, G.4    Mateja, M.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.