Testability features of the first-generation cell processor

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 111-119

  Riley, Mack ^a   Bushard, Louis ^a   Chelstrom, Nathan ^a   Kiryu, Naoki ^b   Ferguson, Steven ^a  

^a IBM   (United States)

^b TOSHIBA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ASYNCHRONOUS MACHINERY; LOGIC DESIGN; SYNCHRONOUS MACHINERY;

ASYNCHRONOUS CLOCK DOMAINS; CELL PROCESSOR; CELL TEST LOGIC;

MICROPROCESSOR CHIPS;

EID: 33847093317     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1583967     Document Type: Conference Paper

References (11)

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