Advanced microprocessor test strategy and methodology

IBM Journal of Research and Development

Volumn 41, Issue 4-5, 1997, Pages 611-626

  Huott, W V ^a   Koprowski, T J ^a   Robbins, B J ^a   Kusko, M P ^a   Pateras, S V ^a   Hoffman, D E ^a   McNamara, T G ^a   Snethen, T J ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER STORAGE; COMPUTER ARCHITECTURE; COMPUTER SOFTWARE; MICROPROCESSOR CHIPS;

CIRCUIT DENSITY;

INTEGRATED CIRCUIT TESTING;

EID: 0031177245     PISSN: 00188646     EISSN: None     Source Type: Journal    
DOI: 10.1147/rd.414.0611     Document Type: Article

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