Case study of the test development for the 2nd generation ColdFire Microprocessors

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 424-432

  Amason, Dale ^a   Crouch, Alfred L ^a   Eisele, Renny ^a   Giles, Grady ^a   Mateja, Michael ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DATA STORAGE EQUIPMENT; MICROPROCESSOR CHIPS;

PATH DELAY TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 0031358774     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)