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Volumn , Issue , 1999, Pages 130-136
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Test and debug features of the AMD-K7 microprocessor
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Author keywords
[No Author keywords available]
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Indexed keywords
AUTOMATIC TESTING;
BUILT-IN SELF TEST;
CMOS INTEGRATED CIRCUITS;
ELECTRONIC EQUIPMENT MANUFACTURE;
ELECTRONIC EQUIPMENT TESTING;
FLIP CHIP DEVICES;
FLIP FLOP CIRCUITS;
LOGIC CIRCUITS;
MICROCOMPUTERS;
RANDOM ACCESS STORAGE;
SHIFT REGISTERS;
YIELD STRESS;
AUTOMATIC TEST PATTERN GENERATION;
BALL GRID ARRAY;
DESIGN FOR DEBUG;
DESIGN FOR TESTABILITY;
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EID: 0033342555
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (29)
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References (6)
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