At-speed testing of delay faults for motorola's MPC7400, a powerPC microprocessor

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2000, Pages 3-8

  Tendolkar, Nandu ^a   Molyneaux, Robert ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS; RESPONSE TIME (COMPUTER SYSTEMS); TIMING CIRCUITS;

DELAY FAULTS; POWERPC MICROPROCESSOR; PROGRAMMABLE CLOCK CONTROL CIRCUIT;

BUILT-IN SELF TEST;

EID: 0033743139     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (12)