Modeling test escape rate as a function of multiple coverages

Proceedings - International Test Conference

Volumn , Issue , 2008, Pages

  Butler, Kenneth M ^a   Carulli Jr , John M ^a   Saxena, Jayashree ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ESCAPE RATE; FAULT COVERAGES; GOLD STANDARDS; MODELING TEST; PRODUCT YIELDS; TEST COVERAGE; TEST PROGRAM; WILLIAMS;

TESTING;

EID: 67249085975     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2008.4700605     Document Type: Conference Paper

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