Assessing the quality level of digital CMOS IC's under the hypothesis of non-uniform distribution of fault probabilities

Proceedings of European Design and Test Conference

Volumn , Issue , 1996, Pages 72-78

  Corsi, F ^a   Marzocca, C ^a   Martino, S ^a  

^a POLITECNICO DI BARI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL INTEGRATED CIRCUITS; FAILURE ANALYSIS; INTEGRATED CIRCUIT TESTING; MATHEMATICAL MODELS; PROBABILITY;

BRIDGING (BRI) FAULTS; NONUNIFORM FAULT PROBABILITY DISTRIBUTION; SINGLE STUCK AT (SSA) FAULTS;

CMOS INTEGRATED CIRCUITS;

EID: 0029755014     PISSN: 10661409     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)