Comparison of delay tests on silicon

Proceedings - International Test Conference

Volumn , Issue , 2006, Pages

  Qiu, Wangqi ^a   Walker, D M H ^a   Simpson, Neil ^b   Reddy, Divya ^b   Moore, Anthony ^b  

^a TEXAS A AND M UNIVERSITY   (United States)

^b TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT TOLERANT COMPUTER SYSTEMS; INTEGRATED CIRCUITS; MOTION PLANNING; NATURAL FREQUENCIES; SEMICONDUCTING SILICON;

DEFECT SIZES; DELAY TESTS; OPERATING FREQUENCIES;

DELAY CIRCUITS;

EID: 39749153485     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2006.297624     Document Type: Conference Paper

References (33)