Quantitative analysis of very-low-voltage testing

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1996, Pages 332-337

  Chang, Jonathan T Y ^a   McCluskey, Edward J ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; DEFECTS; DIGITAL CIRCUITS; ERROR DETECTION; FAILURE ANALYSIS; MOSFET DEVICES; TRANSISTORS; VOLTAGE MEASUREMENT;

DELAY FLAWS; SUPPLY VOLTAGE; VERY LOW VOLTAGE TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 0029718449     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)