Scan vs. functional testing - A comparative effectiveness study on Motorola's MMC2107™

IEEE International Test Conference (TC)

Volumn , Issue , 2001, Pages 443-450

  Tumin, Ken ^a   Vargas, Carmen ^a   Patterson, Ross ^a   Nappi, Chris ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHIP SCALE PACKAGES; COMPUTER SIMULATION; FLASH MEMORY; MULTIPLEXING EQUIPMENT; VECTORS;

REGISTER TRANSFER LANGUAGE (RTL ) CODES;

MICROCONTROLLERS;

EID: 0035683985     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. Automotive electronics council (AEC) - Q100 stress test qualifications for integrated circuits
2. Comparing functional and structural tests
3. In search of the best IC test methods
4. Test development for second-generation cold-fire microprocessors