Invisible delay quality - SDQM model lights up what could not be seen

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 1202-1210

  Sato, Yasuo ^a   Hamada, Shuji ^a   Maeda, Toshiyuki ^a   Takatori, Atsuo ^a   Nozuyama, Yasuyuki ^a   Kajihara, Seiji ^b  

^a Academic Research Center   (Japan)

^b KYUSHU INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATION; ERROR DETECTION; FABRICATION; FAULT TOLERANT COMPUTER SYSTEMS; MATHEMATICAL MODELS; STATISTICAL METHODS;

AUTOMATIC TEST PROGRAM GENERATION (ATPG); FABRICATION PROCESS QUALITY; STATISTICAL DELAY QUALITY MODEL (SDQM); TEST PATTERN QUALITY;

INTEGRATED CIRCUIT TESTING;

EID: 33847156284     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1584088     Document Type: Conference Paper

References (13)

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