Empirical study on the effects of test type ordering on overall test efficiency

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 408-416

  Butler, Kenneth M ^a   Saxena, Jayashree ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; EFFICIENCY; FAILURE (MECHANICAL); FAILURE ANALYSIS; INTEGRATED CIRCUIT MANUFACTURE; MICROPROCESSOR CHIPS; SEMICONDUCTING SILICON;

CATASTROPHIC FAILURES; DEFECT ORIENTED FAILURES; DIGITAL LOGIC TESTER PROGRAM; OVERALL TEST EFFICIENCY; RANDOM ORIENTED FAILURES; TEST TYPE ORDERING;

INTEGRATED CIRCUIT TESTING;

EID: 0034482032     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (24)