Reducing the complexity of defect level modeling using the clustering effect

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2000, Pages 640-644

  De Sousa, José T ^a   Agrawal, Vishwani D ^b  

^a INESC   (Portugal)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

Defect clustering; Defect level; Fault clustering; Fault coverage; Reject ratio

Indexed keywords

CLUSTERING EFFECT; DEFECT CLUSTERING; DEFECT LEVELS; FAULT COVERAGES; MULTIPLE FAULTS; PRODUCTION LINE; REJECT RATIO; YIELD MODELING;

EXHIBITIONS;

DEFECTS;

EID: 0142226173     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2000.840853     Document Type: Conference Paper

References (6)

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4. P. Nigh, W. Needham, K. Butler, P. Maxwell, and R. Aitken. "An Experimental Study Comparing the Relative Effectiveness of Functional, Scan, IDDQ and Delay-fault Testing". In Proc. of IEEE 15th VLSI Test Symp. (VTS), pages 459-464, 1997.
5. T. W. Williams and N. C. Brown. "Defect Level as a Function of Fault Coverage". IEEE Transactions on Computers, C-30(12):987-988, Dec. 1981.
6. J. T. de Sousa, F. M. Goncalves, J. P. Teixeira, and T.W. Williams. "Fault Modeling and Defect Level Projections in Digital IC's". In Proc. European Design and Test Conf. (EDTC), pages 436-442, March 1994.