Microscopic and macroscopic dielectric description of mixed oxide thin films

Journal of Applied Physics

Volumn 102, Issue 8, 2007, Pages

  Ferrer, F J ^a   Yubero, F ^b   Mejias J A ^c   Garcia Lopez F J ^a   Gonzalez Elipe A R ^b  

^a CENTRO NACIONAL DE ACELERADORES   (Spain)

^b INSTITUTO DE CIENCIA DE MATERIALES DE SEVILLA   (Spain)

^c UNIVERSIDAD PABLO DE OLAVIDE   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER PARAMETERS; BAND GAP ENERGY; DIELECTRIC THEORY; ELECTRONIC-POLARIZABILITY; LOCAL PROBES; MIXED-OXIDE THIN FILMS; OPTICAL CHARACTERIZATION; QUANTUM MECHANICAL CLUSTERS;

PHOTOELECTRONS; QUANTUM THEORY; REFRACTIVE INDEX; SILICON; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

TITANIUM OXIDES;

EID: 65649106797     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2801402     Document Type: Article

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