SiO 2-TiO 2 interfaces studied by ellipsometry and x-ray photoemission spectroscopy

Journal of Applied Physics

Volumn 92, Issue 4, 2002, Pages 1922-1928

  Gallas, B ^a   Brunet Bruneau, A ^a   Fisson, S ^a   Vuye, G ^a   Rivory, J ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS INTERFACES; IN-SITU STUDY; INTERFACE FORMATION; TIO; X RAY PHOTOEMISSION SPECTROSCOPY;

PHOTOELECTRON SPECTROSCOPY; SPECTROSCOPIC ELLIPSOMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

TITANIUM DIOXIDE;

EID: 0037103475     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1494843     Document Type: Article

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