Microscopic model for enhanced dielectric constants in low concentration SiO2-rich noncrystalline Zr and Hf silicate alloys

Applied Physics Letters

Volumn 77, Issue 18, 2000, Pages 2912-2914

  Lucovsky, G ^a   Rayner Jr , G B ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012289206     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1320860     Document Type: Article

References (14)

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